Article
Publicly Available
Frontmatter
Published/Copyright:
August 8, 2022
Published Online: 2022-08-08
Published in Print: 2022-09-27
©2022 Walter de Gruyter GmbH, Berlin/Boston
Articles in the same Issue
- Frontmatter
- Community
- Conference and trade show reports
- Topical Issue: Ellipsometry; Guest Editors: Rüdiger Schmidt-Grund, Chris Sturm and Andreas Hertwig
- Views
- Mid-infrared laser ellipsometry: a new era beyond FTIR
- Editorial
- Ellipsometry and polarimetry – classical measurement techniques with always new developments, concepts, and applications
- Tutorial
- Mueller matrix spectroscopic ellipsometry
- Review Articles
- Certain topics in ellipsometric data modeling with splines: a review of recent developments
- Spectroscopic ellipsometry from 10 to 700 K
- Research Article
- Multilevel effective material approximation for modeling ellipsometric measurements on complex porous thin films
Articles in the same Issue
- Frontmatter
- Community
- Conference and trade show reports
- Topical Issue: Ellipsometry; Guest Editors: Rüdiger Schmidt-Grund, Chris Sturm and Andreas Hertwig
- Views
- Mid-infrared laser ellipsometry: a new era beyond FTIR
- Editorial
- Ellipsometry and polarimetry – classical measurement techniques with always new developments, concepts, and applications
- Tutorial
- Mueller matrix spectroscopic ellipsometry
- Review Articles
- Certain topics in ellipsometric data modeling with splines: a review of recent developments
- Spectroscopic ellipsometry from 10 to 700 K
- Research Article
- Multilevel effective material approximation for modeling ellipsometric measurements on complex porous thin films
