Effects of illumination on image reconstruction via Fourier ptychography
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Xinrui Cao
Xinrui Cao was born in Shandong, China. She received her MSc degree in Mechanical Engineering from the Technische Universität Ilmenau in 2014. Since then, she is a PhD student in the Department of Optical Engineering at the Technische Universität Ilmenau. Since April 2017, she is a member of the Research Training Group on ‘Tip- and laser-based 3D-Nanofabrication in extended macroscopic working areas’ funded through the German Research Foundation (DFG). Her research interest is illumination design for imaging systems.
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Stefan Sinzinger
Stefan Sinzinger received his Dipl.-Phys. and Dr degrees from the Friedrich-Alexander Universität Erlangen-Nürnberg, Institute for Applied Optics (Prof Dr A.W. Lohmann) in 1989 and 1993, respectively. In 2002, he became Professor for Optical Engineering (‘Technische Optik’) at the Technische Universität Ilmenau. Among numerous publications in international journals and conferences, Stefan Sinzinger is the co-author of the textbook ‘Microoptics’ and editor of the textbook ‘Optical Information Processing’ (author A.W. Lohmann). His current research focuses on the design, integration, fabrication, and application of (micro-) optical elements and hybrid optical (micro-) systems for innovative imaging and illumination.
Abstract
The Fourier ptychographic microscopy (FPM) technique provides high-resolution images by combining a traditional imaging system, e.g. a microscope or a 4f-imaging system, with a multiplexing illumination system, e.g. an LED array and numerical image processing for enhanced image reconstruction. In order to numerically combine images that are captured under varying illumination angles, an iterative phase-retrieval algorithm is often applied. However, in practice, the performance of the FPM algorithm degrades due to the imperfections of the optical system, the image noise caused by the camera, etc. To eliminate the influence of the aberrations of the imaging system, an embedded pupil function recovery (EPRY)-FPM algorithm has been proposed [Opt. Express 22, 4960–4972 (2014)]. In this paper, we study how the performance of FPM and EPRY-FPM algorithms are affected by imperfections of the illumination system using both numerical simulations and experiments. The investigated imperfections include varying and non-uniform intensities, and wavefront aberrations. Our study shows that the aberrations of the illumination system significantly affect the performance of both FPM and EPRY-FPM algorithms. Hence, in practice, aberrations in the illumination system gain significant influence on the resulting image quality.
About the authors
Xinrui Cao was born in Shandong, China. She received her MSc degree in Mechanical Engineering from the Technische Universität Ilmenau in 2014. Since then, she is a PhD student in the Department of Optical Engineering at the Technische Universität Ilmenau. Since April 2017, she is a member of the Research Training Group on ‘Tip- and laser-based 3D-Nanofabrication in extended macroscopic working areas’ funded through the German Research Foundation (DFG). Her research interest is illumination design for imaging systems.
Stefan Sinzinger received his Dipl.-Phys. and Dr degrees from the Friedrich-Alexander Universität Erlangen-Nürnberg, Institute for Applied Optics (Prof Dr A.W. Lohmann) in 1989 and 1993, respectively. In 2002, he became Professor for Optical Engineering (‘Technische Optik’) at the Technische Universität Ilmenau. Among numerous publications in international journals and conferences, Stefan Sinzinger is the co-author of the textbook ‘Microoptics’ and editor of the textbook ‘Optical Information Processing’ (author A.W. Lohmann). His current research focuses on the design, integration, fabrication, and application of (micro-) optical elements and hybrid optical (micro-) systems for innovative imaging and illumination.
Acknowledgments
The authors gratefully acknowledge the support by the Deutsche Forschungsgemeinschaft (DFG) in the framework of Research Training Group “Tip- and laser-based 3D-Nanofabrication in extended macroscopic working areas” (GRK 2182) at the Technische Universität Ilmenau, Germany.
References
[1] J. R. Fienup, Appl. Opt. 21, 2758–2769 (1982).10.1364/AO.21.002758Suche in Google Scholar PubMed
[2] G. Zheng, R. Horstmeyer and C. Yang, Nat. Photonics 7, 739–745 (2013).10.1038/nphoton.2013.187Suche in Google Scholar PubMed PubMed Central
[3] X. Ou, G. Zheng and C. Yang, Opt. Express 22, 4960–4972 (2014).10.1364/OE.22.004960Suche in Google Scholar PubMed PubMed Central
[4] J. M. Rodenburg and H. M. L. Faulkner, Appl. Phys. Lett. 85, 4795–4797 (2004).10.1063/1.1823034Suche in Google Scholar
[5] H. M. L. Faulkner and J. M. Rodenburg, Ultramicroscopy 103, 153–164 (2005).10.1016/j.ultramic.2004.11.006Suche in Google Scholar PubMed
[6] M. Guizar-Sicairos and J. R. Fienup, Opt. Express 16, 7264–7278 (2008).10.1364/OE.16.007264Suche in Google Scholar PubMed
[7] P. C. Konda, J. M. Taylor and A. R. Harvey, Proc. SPIE 9630, 96300X (2015).10.1117/12.2191338Suche in Google Scholar
[8] A. M. Maiden and J. M. Rodenburg, Ultramicroscopy, 109, 1256–1262 (2009).10.1016/j.ultramic.2009.05.012Suche in Google Scholar PubMed
[9] J. D. Schmidt, in ‘Numerical Simulation of Optical Wave Propagation with Examples in MATLAB’ (Bellingham, WA: SPIE, 2010), pp. 65–68.10.1117/3.866274Suche in Google Scholar
[10] X. Cao, M. Bichra, D. Fischer, M. Krojer, H. Prause, et al., in ‘Illumination Design for Fourier Ptychography’, European Optical Society Annual Meeting (EOSAM) Berlin (26.-30.09.2016).Suche in Google Scholar
[11] J. W. Goodman, in ‘Introduction to Fourier Optics’, 2nd ed. (McGraw-Hill Publishers, New York, 1996) pp. 135–136.Suche in Google Scholar
[12] R. Horstmeyer, X. Qu, J. Chung, G. Zheng and C. Yang, Opt. Express 22, 24062–24080 (2014).10.1364/OE.22.024062Suche in Google Scholar PubMed PubMed Central
[13] R. Horstmeyer and C. Yang, Opt. Express 22, 338–358 (2014).10.1364/OE.22.000338Suche in Google Scholar PubMed PubMed Central
[14] D. Karthaus, M. Giehl, O. Sandfuchs and S. Sinzinger, Appl. Opt. 56, 5234–5241 (2017).10.1364/AO.56.005234Suche in Google Scholar PubMed
©2017 THOSS Media & De Gruyter, Berlin/Boston
Artikel in diesem Heft
- Cover and Frontmatter
- Views
- Interview: What’s next in lithography?
- Community
- News from the European Optical Society EOS
- News
- Topical issue: Ptychography
- Editorial
- Special issue on ptychography
- Tutorial
- An introduction to the theory of ptychographic phase retrieval methods
- Review Articles
- Coherent diffractive imaging methods for semiconductor manufacturing
- Fourier ptychography for high space-bandwidth product microscopy
- Research Articles
- Ptychographic imaging with partially coherent plasma EUV sources
- Effects of illumination on image reconstruction via Fourier ptychography
- Data compression strategies for ptychographic diffraction imaging
- Measurement of large optical elements used for inertial confinement fusion with ptychography
- Research Article
- Design of pre-optics for laser guide star wavefront sensor for the ELT
Artikel in diesem Heft
- Cover and Frontmatter
- Views
- Interview: What’s next in lithography?
- Community
- News from the European Optical Society EOS
- News
- Topical issue: Ptychography
- Editorial
- Special issue on ptychography
- Tutorial
- An introduction to the theory of ptychographic phase retrieval methods
- Review Articles
- Coherent diffractive imaging methods for semiconductor manufacturing
- Fourier ptychography for high space-bandwidth product microscopy
- Research Articles
- Ptychographic imaging with partially coherent plasma EUV sources
- Effects of illumination on image reconstruction via Fourier ptychography
- Data compression strategies for ptychographic diffraction imaging
- Measurement of large optical elements used for inertial confinement fusion with ptychography
- Research Article
- Design of pre-optics for laser guide star wavefront sensor for the ELT
