Startseite The consequences of Petzval correction in lithographic designs
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The consequences of Petzval correction in lithographic designs

  • David Shafer

    David Shafer has headed David Shafer Optical Design, in Fairfield, CT, since 1980. Prior to that, he spent 15 years at Itek Corp., Honeywell Electro-Optics Center, and Perkin-Elmer Corp. Much of his design work has been in lithographic systems and semiconductor inspection systems. He attended the Institute of Optics at the University of Rochester from 1961 to 1966. He has published extensively and has over 125 patents.

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Veröffentlicht/Copyright: 6. Februar 2015
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Abstract

Several design examples show how correcting Petzval curvature in high NA lithographic designs leads to much of the design complexity. There are two cases in which much simpler designs are possible, neither of them practical with today’s technology. One is that of a curved object and/or image system, where no attempt at all is made to control Petzval curvature. The other case is where a diffractive surface is used in the design, which allows Petzval to be easily corrected in relatively simple designs. A very simple 1.1 NA all-refractive immersion design is shown that uses one diffractive surface.


Corresponding author: David Shafer, Optical Design, Fairfield, CT, USA, e-mail:

About the author

David Shafer

David Shafer has headed David Shafer Optical Design, in Fairfield, CT, since 1980. Prior to that, he spent 15 years at Itek Corp., Honeywell Electro-Optics Center, and Perkin-Elmer Corp. Much of his design work has been in lithographic systems and semiconductor inspection systems. He attended the Institute of Optics at the University of Rochester from 1961 to 1966. He has published extensively and has over 125 patents.

References

[1] D. Shafer, SPIE, 0766, 2–9 (1987).Suche in Google Scholar

[2] W. C. Sweatt, JOSA 67, 808–808 (1977).Suche in Google Scholar

[3] D. Shafer, IODC 22, 459 (1994).10.1016/0304-422X(94)90021-3Suche in Google Scholar

[4] H. Feldmann, A. Dodoc, A. Epple, H. Rostalski, D. R. Shafer, W. Ulrich, SPIE 5962–5932 (2005).Suche in Google Scholar

Received: 2014-12-15
Accepted: 2015-1-12
Published Online: 2015-2-6
Published in Print: 2015-2-1

©2015 THOSS Media & De Gruyter

Heruntergeladen am 7.9.2025 von https://www.degruyterbrill.com/document/doi/10.1515/aot-2014-0067/html
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