Home Physical Sciences Novel Application of Anomalous Small-Angle X-Ray Scattering to Characterize Inhomogeneities in Materials
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Novel Application of Anomalous Small-Angle X-Ray Scattering to Characterize Inhomogeneities in Materials

  • A.H. Shinohara, , K. Sugiyama, and Y. Waseda,
Published/Copyright: May 6, 2011

Published Online: 2011-05-06
Published in Print: 1992-04

©2011 by Walter de Gruyter GmbH & Co.

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