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Pre-Frinted Titles of papers to be published in the next issues of physica status solidi (a) and physica status solidi (b)
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Chapters in this book
- Frontmatter I
- Classification Scheme II
- Contents 419
-
Original Papers
-
Structure
- The Use of a Gas-Flow Proportional Counter for the Energetical Analysis of Photoelectrons under X-Ray Diffraction Conditions 427
- Electron-Microscopic Study of Microdefects in Silicon Single Crystals Grown at High Speed 433
- Tiber Morphology Resulting from Solid State Coalescence of Spherical Precipitates 439
- Influence of Annealing Treatments on the Density of Amorphous Fe40Ni40P14B6 and Fe5Co70Si15B10 Alloys 445
- Microstructural Properties of the ß-NiAl Phase in the Ternary Ni-Based Ni-Al-Ta Superalloys 451
- Film and Interface Analysis of InSb MOS Structures 463
-
Defects, atomistic aspects
- The Role of Nonelastic Nuclear Processes in the Formation of Defect Clusters in Semiconductors Irradiated with High-Energy Protons 469
- The Application of the Wulff Construction to Dislocation Problems 473
- High-Temperature Internal Friction Peaks of Pure Aluminum Single-, Bi-, and Polycrystals Measured with an Inverted Flexure Pendulum 485
- Magnetic Anomalies of Self-Diffusion and Co Heterodiffusion in a-Fe 497
-
Magnetism
- Electrical and Magnetic Properties of the Fe18Cr(30-40)Ni Alloys at Low Temperatures 507
- Barkhausen Jumps in a Dual-Phase Steel Treated in the Intercritical Temperature Bange 513
- Effects of Magnetostriction on Vibrations of Bloch and Néel Walls 519
-
Localized electronic states and transitions
- Thermoluminescence Emission and Decay Kinetics of NaCl:SnCI2 Single Crystals 533
- Investigation of the Recombination Mechanism in GaAs0.11P0.89:N 541
- Photoluminescence and Optical Properties of Lithium-Doped MgxZn1-xTe Alloys 549
-
Electric transport
- Optical Phonon Assisted Hopping in (DPPE)(TCNQ)5(H2O) 557
- An Equation for Dynamic Switching in Amorphous Thin Films 563
- A Semi-Classical Model for Simulating Inversion Carrier Transport in Si MOS Devices 569
- DC Conductivity and ESR of Hydrogenated Amorphous Carbon Films 579
- A Method for the Measurement of Thermal Conductivity, Thermal Diffusivity, and Other Transport Coefficients of Thin Films 585
-
Device-related phenomena
- Basics of Electron-Impact-Excited Luminescence Devices 597
- Efficiency and Saturation in AC Thin Film EL Structures 609
- Comparison of MOCYD-Grown with Conventional H-VI Materials Parameters for EL Thin Films 625
- Selected Analytical Tools Yield a Better Insight into Electroluminescent Thin Films 647
- Electroluminescence of SiOx-LnF3 Thin Films 657
- Concentration and Field Dependences of Electroluminescence Decay Kinetics in ZnS:Mn Thin Film Structures 661
- Degradation Model of Red GaP LEDs 669
- Transfer Effects in ODMR Spectra of ZnSe:Mn 675
- Direct Current Electroluminescence in Rare-Earth-Doped Zinc Sulphide 681
- Mechanism oi Excitation of Rare-Earth Complexes in Electroluminescence Devices 687
- Optical Study of ZnS:Mn Thin Films with High Mn Concentrations 695
- EPR Investigations of ZnS:Mn and ZnSe:Mn. Single Crystals, Powders, Thin-Film Structures 701
- On the Polarization of Center Radiation in an Optically Thin Layer. The Resonator Effect on the Phototransition Probability 709
- Annealing of Luminescent ZnSe:Mn Thin Films by a Scanning CW Laser Beam 715
- On the Time Behaviour of Electron Impact Excitation in Thin Film Electroluminescent Devices 723
- On the Mechanism of Electron-Impact-Excited Luminescence in AC Thin Film Devices: ZnSe:Mn 733
- Minority Carrier Lifetime Measurements by Photoluminescence at Room Temperature in GaAs1-xPxN, Te (x = 0.70) 739
-
Erratum
- Erratum zu: Calculation of Neutron-Induced Defect Clusters in Silicon and Comparison with TEM Investigations 751
-
Short Notes
- High Voltage Electron Microscopic (HVEM) Observations of Dislocations in Monocrystalline Gypsum 757
- 4-Cyano-1,3,6-triazacycl[3.3.3]azine — A Homomolecular Organic Semiconductor 761
- Glass-Crystal Transitions in Materials in the System As2S3-As2Te3 767
- High Concentration Fe-Cu and Fe-Ag Alloys Produced by Vapor Quenching 773
- The Surface Roughness Effect in Texture Measurements by the Schulz X-Ray Reflection Method 777
- Light Scattering by Defects in TGS 781
- The Investigation of Hydrogen Diffusion in Palladium by the Chemichromic Effect 785
- Anomalous Heat Conduction of Ion-Implanted Amorphous Layers in Silicon Crystals Using a Laser-Probe Technique 791
- Quantitative EBIC Investigations on Bulk Stacking Faults in Silicon 795
- Internal Friction in Ni-Zn Ferrites 801
- On the Nature of the X-Centers in KC1, Studied by Positron Angular Correlation 805
- The Influence of Minority Carrier Injection on Subthreshold Defects in Silicon 809
- Temperature Dependence of the Magnetic Susceptibility of Teniolite 815
- Thermopower and Resistivity in Correlation to B-Site Magnetic Ordering in Cu-Ni and Cu-Cd Ferrospinels 819
- Magnetic Field Sign Effect on Resonance Absorption in Domain Walls of Orthoferrites 823
- Deep Levels in Czochralski p-Si Due to Heat Treatment at 600 to 900 °C 829
- Systems of Interacting Centers of Photoluminescence in RbMnF3 and KMnF3 835
- Lasting Relaxations and Residual Conductivity in InSe1-xSx Single Crystals 839
- Anomalous Effects of Adsorption on the Electric Conductivity of Some Organic Semiconductor Powders under Pressure 843
- Superconductivity and Atomic Ordering of Pd-Cu-H Solid Solutions 849
- Radiation Defects in Single Crystals of Zinc Diphosphide 855
- Electrical Properties of Annealed InSb Thin Films 859
- Emission Patterns of Tb Doped ZnS Bulk Crystals 863
-
Pre-Frinted Titles
- Pre-Frinted Titles of papers to be published in the next issues of physica status solidi (a) and physica status solidi (b) 869
- Classification Scheme —Continued 877
- Backmatter 878
Chapters in this book
- Frontmatter I
- Classification Scheme II
- Contents 419
-
Original Papers
-
Structure
- The Use of a Gas-Flow Proportional Counter for the Energetical Analysis of Photoelectrons under X-Ray Diffraction Conditions 427
- Electron-Microscopic Study of Microdefects in Silicon Single Crystals Grown at High Speed 433
- Tiber Morphology Resulting from Solid State Coalescence of Spherical Precipitates 439
- Influence of Annealing Treatments on the Density of Amorphous Fe40Ni40P14B6 and Fe5Co70Si15B10 Alloys 445
- Microstructural Properties of the ß-NiAl Phase in the Ternary Ni-Based Ni-Al-Ta Superalloys 451
- Film and Interface Analysis of InSb MOS Structures 463
-
Defects, atomistic aspects
- The Role of Nonelastic Nuclear Processes in the Formation of Defect Clusters in Semiconductors Irradiated with High-Energy Protons 469
- The Application of the Wulff Construction to Dislocation Problems 473
- High-Temperature Internal Friction Peaks of Pure Aluminum Single-, Bi-, and Polycrystals Measured with an Inverted Flexure Pendulum 485
- Magnetic Anomalies of Self-Diffusion and Co Heterodiffusion in a-Fe 497
-
Magnetism
- Electrical and Magnetic Properties of the Fe18Cr(30-40)Ni Alloys at Low Temperatures 507
- Barkhausen Jumps in a Dual-Phase Steel Treated in the Intercritical Temperature Bange 513
- Effects of Magnetostriction on Vibrations of Bloch and Néel Walls 519
-
Localized electronic states and transitions
- Thermoluminescence Emission and Decay Kinetics of NaCl:SnCI2 Single Crystals 533
- Investigation of the Recombination Mechanism in GaAs0.11P0.89:N 541
- Photoluminescence and Optical Properties of Lithium-Doped MgxZn1-xTe Alloys 549
-
Electric transport
- Optical Phonon Assisted Hopping in (DPPE)(TCNQ)5(H2O) 557
- An Equation for Dynamic Switching in Amorphous Thin Films 563
- A Semi-Classical Model for Simulating Inversion Carrier Transport in Si MOS Devices 569
- DC Conductivity and ESR of Hydrogenated Amorphous Carbon Films 579
- A Method for the Measurement of Thermal Conductivity, Thermal Diffusivity, and Other Transport Coefficients of Thin Films 585
-
Device-related phenomena
- Basics of Electron-Impact-Excited Luminescence Devices 597
- Efficiency and Saturation in AC Thin Film EL Structures 609
- Comparison of MOCYD-Grown with Conventional H-VI Materials Parameters for EL Thin Films 625
- Selected Analytical Tools Yield a Better Insight into Electroluminescent Thin Films 647
- Electroluminescence of SiOx-LnF3 Thin Films 657
- Concentration and Field Dependences of Electroluminescence Decay Kinetics in ZnS:Mn Thin Film Structures 661
- Degradation Model of Red GaP LEDs 669
- Transfer Effects in ODMR Spectra of ZnSe:Mn 675
- Direct Current Electroluminescence in Rare-Earth-Doped Zinc Sulphide 681
- Mechanism oi Excitation of Rare-Earth Complexes in Electroluminescence Devices 687
- Optical Study of ZnS:Mn Thin Films with High Mn Concentrations 695
- EPR Investigations of ZnS:Mn and ZnSe:Mn. Single Crystals, Powders, Thin-Film Structures 701
- On the Polarization of Center Radiation in an Optically Thin Layer. The Resonator Effect on the Phototransition Probability 709
- Annealing of Luminescent ZnSe:Mn Thin Films by a Scanning CW Laser Beam 715
- On the Time Behaviour of Electron Impact Excitation in Thin Film Electroluminescent Devices 723
- On the Mechanism of Electron-Impact-Excited Luminescence in AC Thin Film Devices: ZnSe:Mn 733
- Minority Carrier Lifetime Measurements by Photoluminescence at Room Temperature in GaAs1-xPxN, Te (x = 0.70) 739
-
Erratum
- Erratum zu: Calculation of Neutron-Induced Defect Clusters in Silicon and Comparison with TEM Investigations 751
-
Short Notes
- High Voltage Electron Microscopic (HVEM) Observations of Dislocations in Monocrystalline Gypsum 757
- 4-Cyano-1,3,6-triazacycl[3.3.3]azine — A Homomolecular Organic Semiconductor 761
- Glass-Crystal Transitions in Materials in the System As2S3-As2Te3 767
- High Concentration Fe-Cu and Fe-Ag Alloys Produced by Vapor Quenching 773
- The Surface Roughness Effect in Texture Measurements by the Schulz X-Ray Reflection Method 777
- Light Scattering by Defects in TGS 781
- The Investigation of Hydrogen Diffusion in Palladium by the Chemichromic Effect 785
- Anomalous Heat Conduction of Ion-Implanted Amorphous Layers in Silicon Crystals Using a Laser-Probe Technique 791
- Quantitative EBIC Investigations on Bulk Stacking Faults in Silicon 795
- Internal Friction in Ni-Zn Ferrites 801
- On the Nature of the X-Centers in KC1, Studied by Positron Angular Correlation 805
- The Influence of Minority Carrier Injection on Subthreshold Defects in Silicon 809
- Temperature Dependence of the Magnetic Susceptibility of Teniolite 815
- Thermopower and Resistivity in Correlation to B-Site Magnetic Ordering in Cu-Ni and Cu-Cd Ferrospinels 819
- Magnetic Field Sign Effect on Resonance Absorption in Domain Walls of Orthoferrites 823
- Deep Levels in Czochralski p-Si Due to Heat Treatment at 600 to 900 °C 829
- Systems of Interacting Centers of Photoluminescence in RbMnF3 and KMnF3 835
- Lasting Relaxations and Residual Conductivity in InSe1-xSx Single Crystals 839
- Anomalous Effects of Adsorption on the Electric Conductivity of Some Organic Semiconductor Powders under Pressure 843
- Superconductivity and Atomic Ordering of Pd-Cu-H Solid Solutions 849
- Radiation Defects in Single Crystals of Zinc Diphosphide 855
- Electrical Properties of Annealed InSb Thin Films 859
- Emission Patterns of Tb Doped ZnS Bulk Crystals 863
-
Pre-Frinted Titles
- Pre-Frinted Titles of papers to be published in the next issues of physica status solidi (a) and physica status solidi (b) 869
- Classification Scheme —Continued 877
- Backmatter 878