Microstructural Properties of the ß-NiAl Phase in the Ternary Ni-Based Ni-Al-Ta Superalloys

Chapters in this book

1. Frontmatter I
2. Classification Scheme II
3. Contents 419
4. Original Papers
5. Structure
6. The Use of a Gas-Flow Proportional Counter for the Energetical Analysis of Photoelectrons under X-Ray Diffraction Conditions 427
7. Electron-Microscopic Study of Microdefects in Silicon Single Crystals Grown at High Speed 433
8. Tiber Morphology Resulting from Solid State Coalescence of Spherical Precipitates 439
9. Influence of Annealing Treatments on the Density of Amorphous Fe₄₀Ni₄₀P₁₄B₆ and Fe₅Co₇₀Si₁₅B₁₀ Alloys 445
10. Microstructural Properties of the ß-NiAl Phase in the Ternary Ni-Based Ni-Al-Ta Superalloys 451
11. Film and Interface Analysis of InSb MOS Structures 463
12. Defects, atomistic aspects
13. The Role of Nonelastic Nuclear Processes in the Formation of Defect Clusters in Semiconductors Irradiated with High-Energy Protons 469
14. The Application of the Wulff Construction to Dislocation Problems 473
15. High-Temperature Internal Friction Peaks of Pure Aluminum Single-, Bi-, and Polycrystals Measured with an Inverted Flexure Pendulum 485
16. Magnetic Anomalies of Self-Diffusion and Co Heterodiffusion in a-Fe 497
17. Magnetism
18. Electrical and Magnetic Properties of the Fe18Cr(30-40)Ni Alloys at Low Temperatures 507
19. Barkhausen Jumps in a Dual-Phase Steel Treated in the Intercritical Temperature Bange 513
20. Effects of Magnetostriction on Vibrations of Bloch and Néel Walls 519
21. Localized electronic states and transitions
22. Thermoluminescence Emission and Decay Kinetics of NaCl:SnCI₂ Single Crystals 533
23. Investigation of the Recombination Mechanism in GaAs_0.11P_0.89:N 541
24. Photoluminescence and Optical Properties of Lithium-Doped Mg_xZn_1-xTe Alloys 549
25. Electric transport
26. Optical Phonon Assisted Hopping in (DPPE)(TCNQ)₅(H₂O) 557
27. An Equation for Dynamic Switching in Amorphous Thin Films 563
28. A Semi-Classical Model for Simulating Inversion Carrier Transport in Si MOS Devices 569
29. DC Conductivity and ESR of Hydrogenated Amorphous Carbon Films 579
30. A Method for the Measurement of Thermal Conductivity, Thermal Diffusivity, and Other Transport Coefficients of Thin Films 585
31. Device-related phenomena
32. Basics of Electron-Impact-Excited Luminescence Devices 597
33. Efficiency and Saturation in AC Thin Film EL Structures 609
34. Comparison of MOCYD-Grown with Conventional H-VI Materials Parameters for EL Thin Films 625
35. Selected Analytical Tools Yield a Better Insight into Electroluminescent Thin Films 647
36. Electroluminescence of SiO_x-LnF₃ Thin Films 657
37. Concentration and Field Dependences of Electroluminescence Decay Kinetics in ZnS:Mn Thin Film Structures 661
38. Degradation Model of Red GaP LEDs 669
39. Transfer Effects in ODMR Spectra of ZnSe:Mn 675
40. Direct Current Electroluminescence in Rare-Earth-Doped Zinc Sulphide 681
41. Mechanism oi Excitation of Rare-Earth Complexes in Electroluminescence Devices 687
42. Optical Study of ZnS:Mn Thin Films with High Mn Concentrations 695
43. EPR Investigations of ZnS:Mn and ZnSe:Mn. Single Crystals, Powders, Thin-Film Structures 701
44. On the Polarization of Center Radiation in an Optically Thin Layer. The Resonator Effect on the Phototransition Probability 709
45. Annealing of Luminescent ZnSe:Mn Thin Films by a Scanning CW Laser Beam 715
46. On the Time Behaviour of Electron Impact Excitation in Thin Film Electroluminescent Devices 723
47. On the Mechanism of Electron-Impact-Excited Luminescence in AC Thin Film Devices: ZnSe:Mn 733
48. Minority Carrier Lifetime Measurements by Photoluminescence at Room Temperature in GaAs_1-xP_xN, Te (x = 0.70) 739
49. Erratum
50. Erratum zu: Calculation of Neutron-Induced Defect Clusters in Silicon and Comparison with TEM Investigations 751
51. Short Notes
52. High Voltage Electron Microscopic (HVEM) Observations of Dislocations in Monocrystalline Gypsum 757
53. 4-Cyano-1,3,6-triazacycl[3.3.3]azine — A Homomolecular Organic Semiconductor 761
54. Glass-Crystal Transitions in Materials in the System As₂S₃-As₂Te₃ 767
55. High Concentration Fe-Cu and Fe-Ag Alloys Produced by Vapor Quenching 773
56. The Surface Roughness Effect in Texture Measurements by the Schulz X-Ray Reflection Method 777
57. Light Scattering by Defects in TGS 781
58. The Investigation of Hydrogen Diffusion in Palladium by the Chemichromic Effect 785
59. Anomalous Heat Conduction of Ion-Implanted Amorphous Layers in Silicon Crystals Using a Laser-Probe Technique 791
60. Quantitative EBIC Investigations on Bulk Stacking Faults in Silicon 795
61. Internal Friction in Ni-Zn Ferrites 801
62. On the Nature of the X-Centers in KC1, Studied by Positron Angular Correlation 805
63. The Influence of Minority Carrier Injection on Subthreshold Defects in Silicon 809
64. Temperature Dependence of the Magnetic Susceptibility of Teniolite 815
65. Thermopower and Resistivity in Correlation to B-Site Magnetic Ordering in Cu-Ni and Cu-Cd Ferrospinels 819
66. Magnetic Field Sign Effect on Resonance Absorption in Domain Walls of Orthoferrites 823
67. Deep Levels in Czochralski p-Si Due to Heat Treatment at 600 to 900 °C 829
68. Systems of Interacting Centers of Photoluminescence in RbMnF₃ and KMnF₃ 835
69. Lasting Relaxations and Residual Conductivity in InSe_1-xS_x Single Crystals 839
70. Anomalous Effects of Adsorption on the Electric Conductivity of Some Organic Semiconductor Powders under Pressure 843
71. Superconductivity and Atomic Ordering of Pd-Cu-H Solid Solutions 849
72. Radiation Defects in Single Crystals of Zinc Diphosphide 855
73. Electrical Properties of Annealed InSb Thin Films 859
74. Emission Patterns of Tb Doped ZnS Bulk Crystals 863
75. Pre-Frinted Titles
76. Pre-Frinted Titles of papers to be published in the next issues of physica status solidi (a) and physica status solidi (b) 869
77. Classification Scheme —Continued 877
78. Backmatter 878