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A New Approach for n-beam Lattice Image Calculation

  • K. Watanabe , Y. Kikuchi , K. Hiratsuka and H. Yamaguchi
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Volume 109, Number 1 September 16
This chapter is in the book Volume 109, Number 1 September 16
© 2021 Walter de Gruyter GmbH, Berlin/Munich/Boston

© 2021 Walter de Gruyter GmbH, Berlin/Munich/Boston

Chapters in this book

  1. Frontmatter I
  2. Author Index III
  3. Physica status solidi (a) applied research 1
  4. Contents 3
  5. Review Article
  6. Orientation and Strain in Heteroepitaxial Growth 11
  7. Original Papers and Short Notes
  8. Structure; crystallography
  9. Crystallization of Metallic Glass Fe 46 N 31 VSi 8 B 14 39
  10. Contrast of Small SiX Particles in Silicon by Computed HREM Images 53
  11. Icosahedral Phases in the Al-Fe-Cr Alloy System 61
  12. Trial Model for the Tilting Scheme in AgNbO3 Derived by Electron Diffraction and Imaging 67
  13. Anisotropie Deformation of a Crystal Plate and Its Analysis with X-Ray Diffraction Methods 79
  14. Interaction of Anti-Site Defects with Ge Impurity Atoms in Sb2Te3 Single Crystals 93
  15. X-Ray Reflection from and Transmission through a Plane-Parallel Dielectric Plate with Cosine-Like Polarizability (Symmetrical Laue Case) 101
  16. Etude structurale, par diffraction de R-X, des liaisons dans les semiconducteurs ternaires ZnSiAs2, ZnGeAs2 et ZnSnAs 2 111
  17. A New Approach for n-beam Lattice Image Calculation 119
  18. Defects; nonelectronic transport
  19. Accumulation and Transformation of Radiation Defects in Silicon under Different Doses and Intensities of Electron Irradiation 127
  20. Study of the Movement of Oxygen Vacancies in the Orthorhombic Phase of YBa2Cu3O 7-x by Positron Doppler Broadening Spectroscopy 135
  21. Redistribution of Boron in Silicon by High-Temperature Irradiation with Heavy Ions 141
  22. Dislocation Groups, Multipoles, and Friction Stresses in a-CuZn Alloys 149
  23. Lattice properties
  24. Deformation Mechanism Maps and Gettering Diagrams for Single-Crystal Silicon 161
  25. TEM Study of Phases and Domains in NaNbO3 at Room Temperature 171
  26. Low Temperature Plasticity of Brittle Materials 187
  27. EPR Study of SO 4 Radicals in K4LiH3(SO4)4 Crystals 193
  28. X-Ray Analysis of Residual Stress State with Variable Components of Stress Tensor 199
  29. Surfaces, interfaces, thin films; lower-dimensional systems
  30. The Complex AC Susceptibility of Superconducting Y-Bar-CuO Thin Film and Bulk Samples 205
  31. The Current Characteristics of p-i-n and p+-i-p+ Structures Based on Hydrogenated Amorphous Silicon at Various Temperatures and Excitation Levels 211
  32. A Reinvestigation of Ni2Si Thin Film Growth on Si(lll) by TEM and RBS 217
  33. Structural Analysis of Silicon Doped with High Doses of C+ Ions 231
  34. Protective Coatings on GaAs and InP 239
  35. Transient Photocurrents in a-Si:H Diodes: Effects of Deep Trapping 245
  36. Mechanism of Voltage Generation in Bi Films Due to Laser Irradiation 255
  37. Determination of Semiconductor Parameters by Electron Beam Induced Current and Cathodoluminescence Measurements 261
  38. Localized electronic states
  39. Silver Related Deep Levels in Silicon 273
  40. DLTS Study of Deep Level Defects in Cz n-Si Due to Heat Treatment at 600 to 900 °C 279
  41. Investigation of the Oxygen Vacancy Balance in ZnO Ceramics by Means of EPR 295
  42. Electronic transport; superconductivity
  43. The Internal Strain Effect on T0 in the Y-Ba-Al-Cu Oxide Superconductor 301
  44. Magnetic properties; resonances
  45. Low-Temperature Magnetic Transformations in Ferrous Fluorsilicate Induced by Pressure 307
  46. On the Influence of Internal Stress and Magnetizing Frequency on Domain Wall Motion in High-Purity Ni 313
  47. Cluster Structure of the Li-Ti-Zn Ferrite System Studied by Neutron Scattering 319
  48. Dielectric and optical properties
  49. The Indirect Allowed Optical Transitions in (Ga 0.3 In 0.7)2 Se 3 329
  50. Positron Annihilation Studies in Non-Metallic Solids: d-Camphor and Silver Iodide 337
  51. Nonlinear I-U Characteristics and Photoelectret State in Sillenite-Type Crystals 345
  52. Computer Simulation Experiment on the mm-Wave Properties of Indium Phosphide Double Drift Impatts 359
  53. Short Notes
  54. A Special Metastable Phase of Metallic Glass Pd 77.5 Ni 6 Si 16.5 373
  55. SEM-EBIC Investigations of Grain Boundaries in Cadmium Telluride 375
  56. Detection of the Active Layer of A III B V Semiconductor Quantum-Well Structures by High Resolution X-Ray Diffractometry 379
  57. Structure and Properties of Implanted Steels 383
  58. A/2 < 110> Dislocations at the y/y' Interface in a Ni-Based Superalloy 387
  59. Two Trapping Centers in the Photoplastic Effect in CdS 391
  60. Ru-Metal Segregation in Borosilicate Glasses 395
  61. Melting of Multilayered Structures under Pulse Heating (Computational Experiment) 399
  62. Non-Equilibrium Gradient-Zone Crystallization in Semiconductors 403
  63. Contact Resistance Reduction by Implanted n+ -Layers at the Ni/AuGe- GaAs System 407
  64. IR and ESR Studies of the Structural Properties of Hydrogenated Amorphous Carbon Films 411
  65. Electron Microscopy and Optical Studies of Chemically Deposited CuInS2 Thin Films 417
  66. Electrical Activity Peculiarities of Tin and Iron Impurities in the Semiconducting Glass Ge 28.5 Pb 15S 56.5 423
  67. Photoconductivity and Luminescence Spectra of ZnIn2S4 Crystals Irradiated by y-Quanta 427
  68. NMR-Spectroscopy Study of Ca(Cu 30-x Mn x )Mn 4 O 12 Perovskites 431
  69. Magnetization in Films with Modulated Surfaces 435
  70. Magnetic Properties of UCuGe 439
  71. On the Stress Dependence of the Saturation Magnetostriction in Amorphous Alloys 443
  72. Effect of Thickness and Length of the Sample on the Dielectric Constant (e') and Loss (e") Measurements in the Microwave Cavity Perturbation Technique 447
  73. Thermally Stimulated Electron Emission from Triglycine Sulphate Crystals Excited by AC Electric Field 451
  74. Pre-Printed Titles
  75. Pre-Printed Titles of papers to be published in the next issues of physica status solidi (a) and physica status solidi (b) 457
  76. Substance Classification 465
  77. Backmatter 466
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