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Epitaxial Regrowth of Amorphous Si Deposited on Si

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Volume 72, Number 1 July 16
This chapter is in the book Volume 72, Number 1 July 16
© 2021 Walter de Gruyter GmbH, Berlin/Munich/Boston

© 2021 Walter de Gruyter GmbH, Berlin/Munich/Boston

Chapters in this book

  1. Frontmatter V
  2. Contents 3
  3. Review Article
  4. Order-Disorder Transitions in Substitutional Solid Solutions2 11
  5. Original Papers
  6. Kinetics of Accumulation of Radiation Defects and Annihilation of Vacancies and Interstitials in Carbon- and Boron-Containing Silicon 61
  7. Computer Simulation of Dislocation Motion through a Flexible and Reactionable Dislocation Forest of Different Density in NaCl and Mg Crystals 69
  8. MOS and Thyristor Damage Parameters after 2.5 and 15 MeV High Temperature Electron Irradiation3 79
  9. Microhardness, Microstructure, and Blistering ot Helium Irradiated Nickel, Alloy Nickel 201, and Nimonic 90 89
  10. Mössbauer Study of Copper Ferrite 95
  11. Bulk Trapping States in ß-Zinc Phthalocyanine Single Crystals 99
  12. Magnetic Properties of the Diluted B-Spinels Cu„Cr™M^S4 (MIV = Sn, Ti) 105
  13. Optical Reflectance and Electrical Resistance of Polycrystalline Thin Metallic Films 117
  14. Dielectric Relaxation in Manganese-Doped Silver Chloride2 123
  15. Surface Corrosion of Mg-Containing Al-Based Alloys 131
  16. Electron Microscopy Images of Composition-Modulated Crystals 135
  17. On the Influence of Small Magnesium Additions on the Decomposition Behaviour of an Al-Zn (6 at%) Mother Alloy 147
  18. Phase Transformations in Amorphous Zr-Ni Alloys 153
  19. Magnetic Ordering in CrCl« at the Phase Transition 161
  20. Photomagnetic Effect in YIG 169
  21. Eigenschaften einiger Störstellenkomplexe von Zink in Silizium 177
  22. Deviations from Schmid's Law in Thin Copper Single Crystals 189
  23. On the Ewald Summation Technique for 2D Lattices 199
  24. Crystal Growth and Spectroscopic Properties of Nd8+ Ions in Ferroelectric PbsGesOu Crystals 207
  25. Crystallization and Aging Effects in Some Amorphous Ferromagnets 215
  26. Deformation and Slip Behaviour of Cold-Worked Molybdenum Single Crystals at Elevated Temperature 225
  27. Master Equation Approach to Step Growth 239
  28. Current Transport in Al/InAlAs/InGaAs Heterostructures 251
  29. Total and Partial Interference Functions, Radial Atomic Distributions, and Electrical Resistivities for Liquid Indium and Liquid Gallium-Indium Alloys 261
  30. Vacancies in NiGa 273
  31. Electric Field- and Self-Induced Polarization in Ammonium Chloride Crystals 281
  32. Homogeneous Flow in Metallic Glasses 289
  33. Impurity Profiles at Multi-Pulse Electron-Beam Annealing of Ion-Implanted Silicon 301
  34. A Transmission Electron Microscope Study of the Chalcocite-Djurleite Transformation in Topotactically Grown Thin Films of Cu„.S 305
  35. Amorphous Cu-Ag Films with High Stability2 313
  36. Model to Describe the Elastic Modulus of Sintered Materials 325
  37. Kinetic Theory of Crystallization 333
  38. Coincidence Coefficients of Two Space Lattices and Their Lattice Planes 343
  39. On the Magnetization and Magnetostriction of ErZn 353
  40. Mechanoluminescence of Halides and Other Inorganic Crystals 361
  41. Study of Boron Implantation in Ag-Si Layer Structures 369
  42. Electron Diffraction Investigation of the Ag*TaS2 System 375
  43. Epitaxial Regrowth of Amorphous Si Deposited on Si 391
  44. Ion Mixing of Ni and Pt Layers on Si 399
  45. Short Notes
  46. Stacking Faults in Recrystallized Cadmium Sulphide 413
  47. Investigation of Refractive Index Gratings in Electro-Optic Crystals by a Microscope Technique 417
  48. The Influence of Surface Perfection on Photoconductivity in SbSI Single Crystals 421
  49. Influence of Compressibility Anisotropy on the Dislocation Structure of Zinc, Bismuth, and Antimony Bicrystals 423
  50. Kossei Line Broadening near a Scratch on GaP 427
  51. Ferroelectric Phase Transition in (NH^)gZnBr^ 431
  52. Thermal Study of cx-LilO^ Single Crystals below Room Temperature 435
  53. On the Low Temperature Phase Transition in Ammonium Sulfate 439
  54. Comments on the Ey + 0.45 eV Quenched-in Level in Silicon 445
  55. Effect of Nonstoichiometry on Ferromagnetic Resonance in CdCr2S1 Crystals 449
  56. Electrical Resistivity Study of the F.C.C. Co-V Alloys Quenched from 1200 °C 453
  57. On the Pressure Effect on the Hyperfine Magnetic Field in Spinel-Type Ferrites 457
  58. Mobility-Fluctuation 1/f Noise in Nonuniform Nonlinear Samples and in Mesa Structures 465
  59. Investigation of Dark Conductivity and Optical Absorption in Reduced PLZT 469
  60. IR-Absorption in Doped and Undoped VOg 473
  61. Thermal Spectroscopy of Impurity Levels by Optical Absorption in Bulk G a As 477
  62. Transformation of Self-Interstitials in Silicon under Electronic and Thermal Stimulation 481
  63. Hydrogen Passivation of y-Induced Point Defects in Silicon 485
  64. Thermally Stimulated Noise in GaP p-n Junctions 489
  65. Effect of Indium on the Electrical Transport Properties of Epitaxial Thin SnTe Films 495
  66. Composition Changes of NiSi and PtSi Due to Ar+ Ion Bombardment Determined from AES Measurements 501
  67. A New X-Ray Diffraction Method for Thin Film Thickness Estimation 507
https://doi.org/10.1515/9783112495063-039

Chapters in this book

  1. Frontmatter V
  2. Contents 3
  3. Review Article
  4. Order-Disorder Transitions in Substitutional Solid Solutions2 11
  5. Original Papers
  6. Kinetics of Accumulation of Radiation Defects and Annihilation of Vacancies and Interstitials in Carbon- and Boron-Containing Silicon 61
  7. Computer Simulation of Dislocation Motion through a Flexible and Reactionable Dislocation Forest of Different Density in NaCl and Mg Crystals 69
  8. MOS and Thyristor Damage Parameters after 2.5 and 15 MeV High Temperature Electron Irradiation3 79
  9. Microhardness, Microstructure, and Blistering ot Helium Irradiated Nickel, Alloy Nickel 201, and Nimonic 90 89
  10. Mössbauer Study of Copper Ferrite 95
  11. Bulk Trapping States in ß-Zinc Phthalocyanine Single Crystals 99
  12. Magnetic Properties of the Diluted B-Spinels Cu„Cr™M^S4 (MIV = Sn, Ti) 105
  13. Optical Reflectance and Electrical Resistance of Polycrystalline Thin Metallic Films 117
  14. Dielectric Relaxation in Manganese-Doped Silver Chloride2 123
  15. Surface Corrosion of Mg-Containing Al-Based Alloys 131
  16. Electron Microscopy Images of Composition-Modulated Crystals 135
  17. On the Influence of Small Magnesium Additions on the Decomposition Behaviour of an Al-Zn (6 at%) Mother Alloy 147
  18. Phase Transformations in Amorphous Zr-Ni Alloys 153
  19. Magnetic Ordering in CrCl« at the Phase Transition 161
  20. Photomagnetic Effect in YIG 169
  21. Eigenschaften einiger Störstellenkomplexe von Zink in Silizium 177
  22. Deviations from Schmid's Law in Thin Copper Single Crystals 189
  23. On the Ewald Summation Technique for 2D Lattices 199
  24. Crystal Growth and Spectroscopic Properties of Nd8+ Ions in Ferroelectric PbsGesOu Crystals 207
  25. Crystallization and Aging Effects in Some Amorphous Ferromagnets 215
  26. Deformation and Slip Behaviour of Cold-Worked Molybdenum Single Crystals at Elevated Temperature 225
  27. Master Equation Approach to Step Growth 239
  28. Current Transport in Al/InAlAs/InGaAs Heterostructures 251
  29. Total and Partial Interference Functions, Radial Atomic Distributions, and Electrical Resistivities for Liquid Indium and Liquid Gallium-Indium Alloys 261
  30. Vacancies in NiGa 273
  31. Electric Field- and Self-Induced Polarization in Ammonium Chloride Crystals 281
  32. Homogeneous Flow in Metallic Glasses 289
  33. Impurity Profiles at Multi-Pulse Electron-Beam Annealing of Ion-Implanted Silicon 301
  34. A Transmission Electron Microscope Study of the Chalcocite-Djurleite Transformation in Topotactically Grown Thin Films of Cu„.S 305
  35. Amorphous Cu-Ag Films with High Stability2 313
  36. Model to Describe the Elastic Modulus of Sintered Materials 325
  37. Kinetic Theory of Crystallization 333
  38. Coincidence Coefficients of Two Space Lattices and Their Lattice Planes 343
  39. On the Magnetization and Magnetostriction of ErZn 353
  40. Mechanoluminescence of Halides and Other Inorganic Crystals 361
  41. Study of Boron Implantation in Ag-Si Layer Structures 369
  42. Electron Diffraction Investigation of the Ag*TaS2 System 375
  43. Epitaxial Regrowth of Amorphous Si Deposited on Si 391
  44. Ion Mixing of Ni and Pt Layers on Si 399
  45. Short Notes
  46. Stacking Faults in Recrystallized Cadmium Sulphide 413
  47. Investigation of Refractive Index Gratings in Electro-Optic Crystals by a Microscope Technique 417
  48. The Influence of Surface Perfection on Photoconductivity in SbSI Single Crystals 421
  49. Influence of Compressibility Anisotropy on the Dislocation Structure of Zinc, Bismuth, and Antimony Bicrystals 423
  50. Kossei Line Broadening near a Scratch on GaP 427
  51. Ferroelectric Phase Transition in (NH^)gZnBr^ 431
  52. Thermal Study of cx-LilO^ Single Crystals below Room Temperature 435
  53. On the Low Temperature Phase Transition in Ammonium Sulfate 439
  54. Comments on the Ey + 0.45 eV Quenched-in Level in Silicon 445
  55. Effect of Nonstoichiometry on Ferromagnetic Resonance in CdCr2S1 Crystals 449
  56. Electrical Resistivity Study of the F.C.C. Co-V Alloys Quenched from 1200 °C 453
  57. On the Pressure Effect on the Hyperfine Magnetic Field in Spinel-Type Ferrites 457
  58. Mobility-Fluctuation 1/f Noise in Nonuniform Nonlinear Samples and in Mesa Structures 465
  59. Investigation of Dark Conductivity and Optical Absorption in Reduced PLZT 469
  60. IR-Absorption in Doped and Undoped VOg 473
  61. Thermal Spectroscopy of Impurity Levels by Optical Absorption in Bulk G a As 477
  62. Transformation of Self-Interstitials in Silicon under Electronic and Thermal Stimulation 481
  63. Hydrogen Passivation of y-Induced Point Defects in Silicon 485
  64. Thermally Stimulated Noise in GaP p-n Junctions 489
  65. Effect of Indium on the Electrical Transport Properties of Epitaxial Thin SnTe Films 495
  66. Composition Changes of NiSi and PtSi Due to Ar+ Ion Bombardment Determined from AES Measurements 501
  67. A New X-Ray Diffraction Method for Thin Film Thickness Estimation 507
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