Chapter
Publicly Available
3. Polymer surface chemistry: Characterization by XPS
-
, and
Chapters in this book
- Frontmatter i
- Preface v
- Contents vii
- Contributing authors xiii
- 1. Introductory remarks on polymers and polymer surfaces 1
- 2. Investigation of polymer surfaces by time-of-flight secondary ion mass spectrometry 39
- 3. Polymer surface chemistry: Characterization by XPS 73
- 4. Attenuated total reflection-Fourier transform infrared spectroscopy: A powerful tool for investigating polymer surfaces and interfaces 113
- 5. Scanning probe microscopy of polymers 153
- 6. Polymer surface morphology: Characterization by electron microscopies 169
- 7. Wettability: Significance and measurement 207
- 8. Advances of spectroscopic ellipsometry in the analysis of thin polymer films-polymer interfaces 247
- Index 287
Chapters in this book
- Frontmatter i
- Preface v
- Contents vii
- Contributing authors xiii
- 1. Introductory remarks on polymers and polymer surfaces 1
- 2. Investigation of polymer surfaces by time-of-flight secondary ion mass spectrometry 39
- 3. Polymer surface chemistry: Characterization by XPS 73
- 4. Attenuated total reflection-Fourier transform infrared spectroscopy: A powerful tool for investigating polymer surfaces and interfaces 113
- 5. Scanning probe microscopy of polymers 153
- 6. Polymer surface morphology: Characterization by electron microscopies 169
- 7. Wettability: Significance and measurement 207
- 8. Advances of spectroscopic ellipsometry in the analysis of thin polymer films-polymer interfaces 247
- Index 287