8. Analysis of Mineral Surfaces by Atomic Force Microscopy

Chapters in this book

1. Frontmatter I
2. FROM THE SERIES EDITOR. PREFACE III
3. Table of contents V
4. 1. Modern X-ray Diffraction Methods in Mineralogy and Geosciences 1
5. 2. Fundamentals of XAFS 33
6. 3. X-ray Absorption Near-Edge Structure (XANES) Spectroscopy 75
7. 4. Probing of Pressure-Induced Bonding Transitions in Crystalline and Amorphous Earth Materials: Insights from X-ray Raman Scattering at High Pressure 139
8. 5. Luminescence Spectroscopy 175
9. 6. Analytical Transmission Electron Microscopy 219
10. 7. High Resolution Core- and Valence-Level XPS Studies of the Properties (Structural, Chemical and Bonding) of Silicate Minerals and Glasses 271
11. 8. Analysis of Mineral Surfaces by Atomic Force Microscopy 331
12. 9. Optical Spectroscopy 371
13. 10. Spectroscopy from Space 399
14. 11. SR-FTIR Microscopy and FTIR Imaging in the Earth Sciences 447
15. 12. Carryover of Sampling Errors and Other Problems in Far-Infrared to Far-Ultraviolet Spectra to Associated Applications 481
16. 13. Advances in Raman Spectroscopy Applied to Earth and Material Sciences 509
17. 14. Brillouin Scattering and its Application in Geosciences 543
18. 15. NMR Spectroscopy of Inorganic Earth Materials 605
19. 16. Electron Paramagnetic Resonance Spectroscopy: Basic Principles, Experimental Techniques and Applications to Earth and Planetary Sciences 655
20. 17. Theoretical Approaches to Structure and Spectroscopy of Earth Materials 691
21. 18. High-pressure Apparatus Integrated with Synchrotron Radiation 745
22. 19. In situ High-Temperature Experiments 779