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X-ray and electron microscopic determination of Debye characteristic temperature, stacking fault energy and other microstructural parameters in zinc telluride films
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August 25, 2010
Abstract
X-ray diffraction, transmission electron microscopy and transmission electron diffraction have been performed on polycrystalline zinc telluride films deposited on glass substrates at different conditions. Along with the cubic phase, the hexagonal phase is detected in the films deposited at 623 K and higher substrate temperatures. Lattice parameters of both phases are calculated from X-ray diffraction and TED data and their variation with the film thickness and substrate temperatures are studied. Cation – cation distances in films of the cubic phase are calculated. Stacking fault energy and Debye characteristic temperature in ZnTe films, their variations with film thickness and substrate temperature are reported for the first time. Attempts have been made to explain the variations in terms of existing theories.
Published Online: 2010-08-25
Published in Print: 1990
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- Crystal structure of N-(1-ethylcarbamoyl-tetrazol-5-yl)-O-(4-tolyl)-isourea
- Analysis of the distribution of impurities in crystals by anomalous X-ray scattering
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