Home Physical Sciences Optical interferometry and photoacoustics as in-situ techniques to characterize the porous silicon formation: a review
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Optical interferometry and photoacoustics as in-situ techniques to characterize the porous silicon formation: a review

  • Cristian F. Ramirez-Gutierrez EMAIL logo , Jorge D. Castaño-Yepes and Mario E. Rodriguez-Garcia
Published/Copyright: July 25, 2018
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Received: 2018-03-12
Revised: 2018-04-09
Accepted: 2018-04-09
Published Online: 2018-07-25

© 2018 Cristian F. Ramirez-Gutierrez, published by De Gruyter

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