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Picosecond imaging of signal propagation in integrated circuits

  • Sven Frohmann EMAIL logo , Enrico Dietz , Helmar Dittrich and Heinz-Wilhelm Hübers
Published/Copyright: March 15, 2017
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Abstract:

Optical analysis of integrated circuits (IC) is a powerful tool for analyzing security functions that are implemented in an IC. We present a photon emission microscope for picosecond imaging of hot carrier luminescence in ICs in the near-infrared spectral range from 900 to 1700 nm. It allows for a semi-invasive signal tracking in fully operational ICs on the gate or transistor level with a timing precision of approximately 6 ps. The capabilities of the microscope are demonstrated by imaging the operation of two ICs made by 180 and 60 nm process technology.

Acknowledgments

H.D. acknowledges support from the Helmholtz Research School on Security Technologies.

  1. Funding: German Federal Ministry of Education and Research (BMBF); The IKT2020 Program (16KIS0014).

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Received: 2017-1-4
Accepted: 2017-2-7
Published Online: 2017-3-15
Published in Print: 2017-4-1

©2017 THOSS Media & De Gruyter

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