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On The New Better Than Used Renewal Failure Rate at Specified Time
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M. A. W. Mahmoud
, N. A. Abdul Alim and L. S. Diab
Published/Copyright:
March 15, 2010
Abstract
In this paper we introduce a new class of life distribution called the new better (worse) than used renewal failure rate at specified time t0 NBURFR-t0 (NWURFR-t0). Some closure properties, such as closure under convolution, arbitrary and general mixture, and Shock model are discussed. Furthermore, a nonparametric test is proposed to test exponentiality against the NBURFR-t0 class. The critical values, the powers and Pitman efficiencies are calculated for t0 = 0:25.
Keywords:: U-statistic; hypotheses testing; life testing; exponential distribution; goodness of fit; Mont Carlo method
Published Online: 2010-03-15
Published in Print: 2009-April
© Heldermann Verlag
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Keywords for this article
U-statistic;
hypotheses testing;
life testing;
exponential distribution;
goodness of fit;
Mont Carlo method
Articles in the same Issue
- Defining Precision for Reliable Measurement and Estimation Procedures
- Some Aspects of Discrete Hazard Rate Function in Telescopic Families
- Generalized Loss of Memory Property and a Multivariate Extension
- Threshold Autoregressive Individuals Control Charts
- A Group Acceptance Sampling Plans for Lifetimes Following a Generalized Exponential Distribution
- On The New Better Than Used Renewal Failure Rate at Specified Time
- A Novel Markov System Dynamics Framework for Reliability Analysis of Systems
- SS-CUSUM Chart
- Economic Design of Moving Average Control Chart for Continued and Ceased Production Process
- Estimation of System Reliability under Bivariate Rayleigh Distribution