Control charts are widely used in statistical process control to detect changes in a production process and for monitoring a process to make sure that it is in control. In conventional statistical process control, the pattern of chance causes is often assumed to follow normal distribution. It is well known that the assumption of normality or any specific parametric form for the process distribution is too restrictive. In such situations, distribution-free or nonparametric control charts can serve the purpose better. In this paper, distribution-free control charts are developed based on a class of one-sample test statistics with sub-samples of size two due to Mehra, Prasad and Madhava Rao (Austral. J. Statist. 32: 373392, 1990). The control charts based on their statistic (-chart) are easy to understand and to use. The performance of the proposed procedures is studied through the average run length, which is the expected number of samples required by the procedure to signal out of control. It is observed that the performance of the proposed chart is better than the existing charts in the literature.
Contents
-
Requires Authentication UnlicensedA Nonparametric Control Chart for Location Based on Sub-Samples of Size TwoLicensedDecember 1, 2011
-
Requires Authentication UnlicensedAvailability of a System with Multiple Failure Modes and Imperfect RepairsLicensedDecember 1, 2011
-
Requires Authentication UnlicensedSampling Methods and Market SurveillanceLicensedDecember 1, 2011
-
Requires Authentication UnlicensedControl Charts for Controlling Variability of Non-Normal ProcessesLicensedDecember 1, 2011
-
Requires Authentication UnlicensedA Class of Weighted Gamma Distributions and its PropertiesLicensedDecember 1, 2011
-
Requires Authentication UnlicensedSequential Test for Truncated Distribution under Measurement ErrorLicensedDecember 1, 2011
-
Requires Authentication UnlicensedExact Distribution of Argmax (Argmin)LicensedDecember 1, 2011
-
Requires Authentication UnlicensedA Hybrid Economic Group Acceptance Sampling Plan for Exponential Lifetime DistributionLicensedDecember 1, 2011
-
Requires Authentication UnlicensedChain Sampling Inspection Plans Based on Bayesian MethodologyLicensedDecember 1, 2011
-
Requires Authentication UnlicensedExponentiated Modified Weibull DistributionLicensedDecember 1, 2011
-
Requires Authentication UnlicensedOptimal Control of a Two-Item Inventory System with Different Types of Item DeteriorationLicensedDecember 1, 2011
-
Requires Authentication UnlicensedTesting Exponentiality Against NBUL Alternatives Using Positive and Negative Fractional MomentsLicensedDecember 1, 2011