A Mechanical Method for Preparing TEM Samples from Brittle Films on Compliant Substrates
-
A.A. Taylor
Abstract
Preparing transmission electron microscopy (TEM) samples from thin films is technically challenging and traditional preparation routes can sometimes introduce unacceptable artefacts or even prove impossible. A novel method of preparing plan view TEM samples from thin films by a purely mechanical method is assessed. Two examples of films prepared by this route are briefly presented, a Cr film on PET and an amorphous AlxOy film on Cu. The application of this method allows for TEM analysis of the Cr film without the problems associated with a polymer such as PET disintegrating under the electron beam. For the AlxOy films it is demonstrated that this purely mechanical preparation prevents crystallisation of the film resulting from conventional ion milling preparation routes. The technique also allows for an upper bound of thickness approximation for these films.
Literatur / References
[1] S.P.Lacour, S.Wagner, Appl. Phy. Lett.822404 (2003).Search in Google Scholar
[2] S.P.Lacour, C.Tsay, S.Wagner, IEEE Electron Device Lett.25792 (2004).Search in Google Scholar
[3] O.Kyrylov, R.Cremer, D.Neuschütz, Surface and Coatings Tech. 163–164203 (2002).10.1016/S0257-8972(02)00482-6Search in Google Scholar
[4] P.H.Mayrhofer, C.Mitterer, L.Hultman, H.Clemens, Prog. Mater. Sci.511032 (2006).Search in Google Scholar
[5] J.Rice, Food Process.78 (1992).10.1533/9780857090713.2.258Search in Google Scholar
[6] Y.Leterrier, Prog. Mater. Sci.481 (2003).Search in Google Scholar
[7] G.Saada, Phil Mag85 3003 (2005).10.1080/14786430500154489Search in Google Scholar
[8] G.Dehm, T.J.Balk, H.Edongué, E.Arzt, Microelectr. Eng.70412 (2003).Search in Google Scholar
[9] S.Zhang, D.Sun, Y.Fu, H.Du, Thin Solid Films447–448462 (2004).10.1016/S0040-6090(03)01125-8Search in Google Scholar
[10] L.A.Gianuzzi, F.A.Stevie, Micron30197 (1999).Search in Google Scholar
[11] V.Edlmayr, M.Moser, C.Walter, C.Mitterer, Surf. Coat. Technol.2041576 (2010).Search in Google Scholar
[12] J.C.Bravman, R.Sinclair, J.ElectronMicroscopy Tech. 153 (1984).Search in Google Scholar
[13] KFriedrich, Pract. Metallography16321 (1979).Search in Google Scholar
[14] C.Pan, P.Shen, S.-Y.Chen, J.CrystalGrowth.299393 (2007).10.1111/j.2041-210X.2011.00155.xSearch in Google Scholar
[15] A.F.Jankowski, M.A.Wall, J. Mater. Res.931 (1994).Search in Google Scholar
[16] I.Levin, D.Brandon, J. Am. Cer. Soc.811995 (1998).Search in Google Scholar
© 2011, Carl Hanser Verlag, München
Articles in the same Issue
- Contents/Inhalt
- Inhalt / Contents
- Editorial
- Editorial
- Technical Contributions/Fachbeiträge
- Charakterisierung der Dispersität der Mikrostruktur von Wolframschmelzcarbiden
- Microstructural Changes during Vacuum Carburizing of Steels
- A Mechanical Method for Preparing TEM Samples from Brittle Films on Compliant Substrates
Articles in the same Issue
- Contents/Inhalt
- Inhalt / Contents
- Editorial
- Editorial
- Technical Contributions/Fachbeiträge
- Charakterisierung der Dispersität der Mikrostruktur von Wolframschmelzcarbiden
- Microstructural Changes during Vacuum Carburizing of Steels
- A Mechanical Method for Preparing TEM Samples from Brittle Films on Compliant Substrates