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Focused Ion Beam: A Versatile Technique for the Fabrication of Nano-Devices

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Published/Copyright: May 5, 2013
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Practical Metallography
From the journal Practical Metallography Volume 46 Issue 3

Received: 2008-9-1
Accepted: 2008-12-5
Published Online: 2013-05-05
Published in Print: 2009-03-01

© 2009, Carl Hanser Verlag, München

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  1. Contents/Inhalt
  2. Inhalt / Contents
  3. Technical Contributions/Fachbeiträge
  4. Investigation on Manganese Sulfide Inclusion Sizes in 50CrMo4 Steels by means of Fractography, Micrograph Analysis and Immersion Ultrasound
  5. Quantification of the Impact of Strontium on the Solidification Path of the Aluminum-Silicon-Copper Alloys Using Thermal Analysis Technique
  6. Focused Ion Beam: A Versatile Technique for the Fabrication of Nano-Devices
  7. Materialographic Report/Bericht aus der Materialographie
  8. Arbeitskreis “Präparation” im Fachausschuss Materialografie der Deutschen Gesellschaft für Materialkunde
https://doi.org/10.3139/147.110006

Articles in the same Issue

  1. Contents/Inhalt
  2. Inhalt / Contents
  3. Technical Contributions/Fachbeiträge
  4. Investigation on Manganese Sulfide Inclusion Sizes in 50CrMo4 Steels by means of Fractography, Micrograph Analysis and Immersion Ultrasound
  5. Quantification of the Impact of Strontium on the Solidification Path of the Aluminum-Silicon-Copper Alloys Using Thermal Analysis Technique
  6. Focused Ion Beam: A Versatile Technique for the Fabrication of Nano-Devices
  7. Materialographic Report/Bericht aus der Materialographie
  8. Arbeitskreis “Präparation” im Fachausschuss Materialografie der Deutschen Gesellschaft für Materialkunde
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