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Electrophoresis deposition of metal nanoparticles with reverse micelles onto InP

  • Karel Zdansky , Jiri Zavadil , Pavel Kacerovsky , Jan Lorincik , Jan Vanis , Frantisek Kostka , Ondrej Cernohorsky , Anton Fojtik , Jan Reboun and Jan Cermak
Published/Copyright: June 11, 2013
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Abstract

Nanolayers were deposited onto surfaces of n-type InP single crystal wafers by electrophoresis from reverse micelle colloid solutions containing palladium nanoparticles. Two types of nanolayers were deposited, by applying a positive potential or a negative potential on the InP wafer. Further, wafers with nanolayers were annealed in high vacuum at 400 °C. The nanolayers were studied using capacitance–voltage characteristics on a mercury probe, by atomic force microscopy and by secondary-ion mass spectroscopy. Two types of Schottky-like diodes were prepared on wafers with the two types of nanolayers and studied by current–voltage characteristics. The diodes with nanolayers deposited by applying the positive potential, which contained Pd nanolayers, showed characteristics with better rectifying properties than the other type of diodes. Correlations among measured characterizations were found.


* Correspondence address, Dr. Karel Zdansky Institute of Photonics and Electronics Academy of Sciences of the Czech Republic Chaberska 57, 18251 Praha 8, Czech Republic Tel.: +420 266 773 416 Fax: +420 284 680 222 E-mail:

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Received: 2008-8-27
Accepted: 2009-6-23
Published Online: 2013-06-11
Published in Print: 2009-09-01

© 2009, Carl Hanser Verlag, München

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