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In-situ SEM/EBSD observation of abnormal grain growth in electrodeposited nanocrystalline nickel

  • Sadahiro Tsurekawa , Tatsuya Fukino and Takashi Matsuzaki
Published/Copyright: June 11, 2013

Abstract

An in-situ SEM/EBSD technique has been applied to observe initial-stage and late-stage abnormal grain growth in electrodeposited nanocrystalline nickel with the aim of obtaining a comprehensive understanding of the dynamics of abnormal grain growth. We found that the late-stage abnormal grain growth occurred in an anisotropic manner such that the area of faceted {001} planes increased, and the faceted interface migrated by step motion. During abnormal grain growth, low-angle boundary and low- CSL boundaries such as 3 and 9 were found to migrate more slowly than random boundaries. As a result, small grains that possessed a CSL relation with the abnormally growing grain were often embedded into the abnormal grain. Initial-stage and late-stage abnormal grain growth both obeyed a parabolic growth law.


* Correspondence address, Prof. Sadahiro Tsurekawa Department of Materials Science and Engineering Graduate School of Science and Technology Kumamoto University 2-29-1, Kurokami, Kumamoto 860-8555, Japan Tel.: +81 96 342 3539 Fax: +81 96 342 3539 E-mail:

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Received: 2008-9-10
Accepted: 2009-4-1
Published Online: 2013-06-11
Published in Print: 2009-06-01

© 2009, Carl Hanser Verlag, München

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