On ‘interface-plane scheme’ and symmetric grain boundaries
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Adam Morawiec
Abstract
Quantitative analysis of grain boundaries relies on proper boundary parameterizations. One of the approaches to identification of boundaries is the ‘interface-plane scheme’. A rigorous examination reveals that this approach is deficient. It is demonstrated that the ‘interface-plane scheme’ fails to satisfy necessary conditions for a parameterization. Moreover, the difference between boundaries symmetric in the conventional sense and those termed as symmetric in the ‘interface-plane scheme’ is clarified. Also the relationship of these boundaries to twist and tilt boundaries is analyzed. Revealing the unsuitability of the ‘interface-plane scheme’ for boundary parameterization and eliminating the confusion caused by the incompatible definitions of symmetric boundaries is of importance for the progress in analysis of homophase interfaces.
© by Oldenbourg Wissenschaftsverlag, Krakow, Germany
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Articles in the same Issue
- A crystal chemical approach to superconductivity. II. An analysis of local bond-valence distribution in inorganic compounds
- Statistical direct methods revisited. Solving the constraints
- On ‘interface-plane scheme’ and symmetric grain boundaries
- Crystal structure determination of Hägg carbide, χ-Fe5C2 by first-principles calculations and Rietveld refinement
- Structure determination of [3Fe2S] complex with complicated pseudo-merohedric twinning
- Persistence of the {…HOCO…HCN} heterosynthon in the co-crystals formed between anthranilic acid and three bipyridine-containing molecules
