Article
Publicly Available
Direct methods and refinement in electron and X-ray crystallography – diketopiperazine revisited
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Douglas L. Dorset
Published/Copyright:
April 19, 2010
Published Online: 2010-04-19
Published in Print: 2010-03
© by Oldenbourg Wissenschaftsverlag, München, Germany
Articles in the same Issue
- Editorial: Precession Electron Crystallography
- Characteristics of precession electron diffraction intensities from dynamical simulations
- Structure determination of the intermediate tin oxide Sn3O4 by precession electron diffraction
- The strong phase object approximation may allow extending crystallographic phases of dynamical electron diffraction patterns of 3D protein nano-crystals
- Structure determination of the zeolite IM-5 using electron crystallography
- Direct methods and refinement in electron and X-ray crystallography – diketopiperazine revisited
- Collecting 3D electron diffraction data by the rotation method
- Automated nanocrystal orientation and phase mapping in the transmission electron microscope on the basis of precession electron diffraction
- Precession electron diffraction and its advantages for structural fingerprinting in the transmission electron microscope
Keywords for this article
Electron crystallogaphy;
X-ray crystallography;
Direct methods;
Refinement;
Structure comparison
Articles in the same Issue
- Editorial: Precession Electron Crystallography
- Characteristics of precession electron diffraction intensities from dynamical simulations
- Structure determination of the intermediate tin oxide Sn3O4 by precession electron diffraction
- The strong phase object approximation may allow extending crystallographic phases of dynamical electron diffraction patterns of 3D protein nano-crystals
- Structure determination of the zeolite IM-5 using electron crystallography
- Direct methods and refinement in electron and X-ray crystallography – diketopiperazine revisited
- Collecting 3D electron diffraction data by the rotation method
- Automated nanocrystal orientation and phase mapping in the transmission electron microscope on the basis of precession electron diffraction
- Precession electron diffraction and its advantages for structural fingerprinting in the transmission electron microscope
