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Determination of dispersion and polarization of thermal plane waves in crystals
Published/Copyright:
July 28, 2010
Abstract
The dispersion of the thermal plane waves (phonons) in crystals can be determined from the x-ray diffraction intensity distribution around a reciprocal lattice point. In the method presented here no higher-order phonon-scattering corrections are necessary. It is shown furthermore that polarizations and dispersion of the phonons can be determined from the intensity distributions around six properly chosen reciprocal lattice points.
Published Online: 2010-7-28
Published in Print: 1971-9-1
© 2015 Oldenbourg Wissenschaftsverlag GmbH, Rosenheimer Str. 145, 81671 München
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- The crystal structure of the mono-potassium salt of l-aspartic acid dihydrate
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- Protoenstatite: a crystal-structure refinement at 1100°C
- Electrostatic energy calculations of diaspore (α AlOOH), goethite (α FeOOH) and groutite (α MnOOH)
- U–O bond lengths and force constants in some uranyl minerals
- The crystal structure of 2,3,4,4-tetrachloro-1-keto-naphthalenedihydride at −160°C,
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