Article
Licensed
Unlicensed
Requires Authentication
FREQUENTIST VALIDITY OF HIGHEST POSTERIOR DENSITY REGIONS IN THE PRESENCE OF NUISANCE PARAMETERS
-
Jayanta K. Ghosh
Published/Copyright:
February 1, 1995
Published Online: 1995-02
Published in Print: 1995-02
© 2014 Oldenbourg Wissenschaftsverlag GmbH, Rosenheimer Str. 145, 81671 München
You are currently not able to access this content.
You are currently not able to access this content.
Articles in the same Issue
- Index
- SOME REMARKS ON OPTIMAL KERNEL FUNCTIONS
- SOME ADAPTIVE ESTIMATORS IN SIMPLE REGRESSION MODELS
- FREQUENTIST VALIDITY OF HIGHEST POSTERIOR DENSITY REGIONS IN THE PRESENCE OF NUISANCE PARAMETERS
- Rates of Convergence for Best Entropy Estimates
- COMPLETE CLASSES OF TESTS FOR SOME NONPARAMETRIC HYPOTHESES
- ON CONVERGENCE RATES OF MONOTONE EMPIRICAL BAYES TESTS FOR THE CONTINUOUS ONE-PARAMETER EXPONENTIAL FAMILY
- INVARIANTLY OPTIMAL LOOK ON RELIABILITY ESTIMATION IN THE EXPONENTIAL CASE
- INSTRUCTIONS TO AUTHORS
- Impressum
Articles in the same Issue
- Index
- SOME REMARKS ON OPTIMAL KERNEL FUNCTIONS
- SOME ADAPTIVE ESTIMATORS IN SIMPLE REGRESSION MODELS
- FREQUENTIST VALIDITY OF HIGHEST POSTERIOR DENSITY REGIONS IN THE PRESENCE OF NUISANCE PARAMETERS
- Rates of Convergence for Best Entropy Estimates
- COMPLETE CLASSES OF TESTS FOR SOME NONPARAMETRIC HYPOTHESES
- ON CONVERGENCE RATES OF MONOTONE EMPIRICAL BAYES TESTS FOR THE CONTINUOUS ONE-PARAMETER EXPONENTIAL FAMILY
- INVARIANTLY OPTIMAL LOOK ON RELIABILITY ESTIMATION IN THE EXPONENTIAL CASE
- INSTRUCTIONS TO AUTHORS
- Impressum
