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Measurement of the half-life of 132I

  • Guo-Shu Mao , Sheng-Dong Zhang , Lei Yang , You-Qian Ding and An-Zhi Cui
Published/Copyright: September 25, 2009

Summary

The half-life of 132I was determined using a HPGe detector by place-relay method; calibrating efficiency was avoided by counting alternately at different places. In order to simplify the treatment of data, the realtime of every counting interval was set the same. Two ways, iteration and translation, were adopted to deal with the data. The obtained half-life value of 132I was (2.283 ± 0.002) h which has been checked and proven to be credible.

Received: 2005-11-2
Accepted: 2006-3-1
Published Online: 2009-9-25
Published in Print: 2006-8-1

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