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Modern non-destructive testing

• Jürgen Beyerer

  Jürgen Beyerer has been a full professor for informatics at the Institute for Anthropomatics and Robotics at the Karlsruhe Institute of Technology (KIT) since March 2004 and director of the Fraunhofer Institute of Optronics, System Technologies and Image Exploitation (IOSB) in Ettlingen, Karlsruhe, Ilmenau, Lemgo, Görlitz. He is Spokesman of the Fraunhofer Group for Defense and Security VVS and he is member of acatech, National Academy of Science and Engineering. Furthermore, he is Head of team 7 of the platform “Lernende Systeme” and Spokesman of the Competence Center Robotic Systems for Decontamination in Hazardous Environments (ROBDEKON). Research interests include automated visual inspection, signal and image processing, pattern recognition, metrology, information theory, machine learning, system theory security, autonomous systems and automation.

  and Randolf Hanke

  Fraunhofer Institute for Nondestructive Testing IZFP Randolf Hanke studied Physics at the Friedrich-Alexander-Universität Erlangen-Nürnberg and received his diploma in 1988 in the field of Applied Physics. He received his doctor’s degree in 1996 with an external thesis at the Chair of Technical Electronics of the University Erlangen. In 1989, he started his scientific career as a scientist at the Fraunhofer Institute for Integrated Circuits IIS in Erlangen in the field of Industrial X-Ray Inspection. Since 1998, R. Hanke was appointed managing director of the department Development Center for X-ray Technology. In 2010, Randolf Hanke was appointed to an endowed professorship at the Julius-Maximilians-Universität Würzburg for the Chair “X-ray Microscopy” at the Faculty of Physics and Astronomy. In November 2010, he was appointed deputy director of the Fraunhofer Institute for Integrated Circuits IIS. Since April 2013 Randolf Hanke is head of the division Fraunhofer Development Center X-Ray Technology of Fraunhofer IIS and since October 2013 he is managing director of the Fraunhofer Institute for Nondestructive Testing IZFP, Saarbrücken. In 2016, R. Hanke was appointed honorary professor of Non-destructive Testing for Material Characterization at the University of Saarland. His main research fields currently are nano-computed tomography and radioscopy, including physics of X-ray generation, phase contrast imaging, interaction and detection. Furtheron, another research area is the volume data image processing of high-resolution CT data.