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Contemporary evaluation of measurement uncertainties in vector network analysis

  • Markus Zeier

    Markus Zeier received the Dipl. Phys. degree and the PhD degree in experimental nuclear physics from the University of Basel, Switzerland, in 1993 and 1999. He is currently with the RF & MW Laboratory of the Federal Institute of Metrology METAS, Switzerland. His research interests are in RF & MW metrology and measurement uncertainty evaluation.

    Federal Institute of Metrology METAS, Lindenweg 50, Bern-Wabern 3003, Switzerland, T: +41 58 387 04 91

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    , Johannes Hoffmann

    Johannes Hoffmann received the Dipl. Ing. degree in electrical engineering from the University of Stuttgart, Stuttgart, Germany, in 2005, the Ing. degree from the Ecole Nationale Superieure des Telecommunications (ENST), Paris, France, in 2005, in the course of a double diploma program. In 2009 he received the Ph.D. degree from ETH Zurich, Zurich, Switzerland. He is currently with the RF & MW Laboratory of the Federal Institute of Metrology METAS, Switzerland. His research interests are in general measurements, which involve microwaves, uncertainty calculation and numerical modeling.

    Federal Institute of Metrology METAS, Lindenweg 50, Bern-Wabern 3003, Switzerland

    , Juerg Ruefenacht

    Juerg Ruefenacht received the Bachelor's degree in electrical and electronic engineering from the Bern University of Applied Sciences, Bern, Switzerland, in 1986. From 1986 to 1998, he was with the Research and Development Department, Swisscom (formerly Swiss PTT). In 1998, he joined the Federal Instiute of Metrology METAS, Switzerland, where he is currently with the RF & MW laboratory.

    Federal Institute of Metrology METAS, Lindenweg 50, Bern-Wabern 3003, Switzerland

    and Michael Wollensack

    Michael Wollensack received the Bachelor degree in electrical and electronic engineering from the Bern University of Applied Sciences, Bern, Switzerland, in 2003. Since then he's with the RF & MW Laboratory, METAS Bern. His research interests are metrological and scientific software, VNA calibration algorithms and VNA measurement uncertainty calculation.

    Federal Institute of Metrology METAS, Lindenweg 50, Bern-Wabern 3003, Switzerland

Published/Copyright: January 11, 2017

Abstract

The evaluation of measurement uncertainties in vector network analysis is a demanding task. The metrology guide EURAMET cg-12 (formerly EA 10/12) is dedicated to this topic and serves as a guideline for calibration laboratories and national metrology institutes. The guide has been revised, acknowledging the technical progress in the field. The new method is in agreement with relevant standards on uncertainty evaluation.

Zusammenfassung

In der Hochfrequenzmesstechnik werden mit dem Vektornetzwerkanalysator Reflexion und Transmission in Amplitude und Phase als Funktion der Frequenz gemessen. Dazu muss das Gerät vorgängig kalibriert werden. Die mehrdimensionale Messgrösse, der mehrstufige Messprozess und die relativ grosse Datenmenge erschweren jedoch die Berechnung der Messunsicherheit. Das Dokument EURAMET cg-12 (früher EA 10/12) befasst sich mit dieser Thematik und dient als massgebende Richtlinie für Kalibrierlabors und nationale Metrologieinstitute. Die darin aufgezeigte Methode der Messunsicherheitsberechnung ist jedoch unvollständig und macht Annahmen, die einer näheren Überprüfung nicht standhalten. Das Dokument wurde überarbeitet unter Berücksichtigung des technischen Fortschritts in der Hochfrequenzmetrologie. Die neue überarbeitete Methode richtet sich nach den GUM-Dokumenten und damit relevanten Standards der Messunsicherheitsberechnung. Dabei wird der gesamte Messprozess in einem Messmodell erfasst. Dadurch werden sämtliche Faktoren, welche die Messung beeinflussen, in der Messunsicherheit berücksichtigt. Da dies aber zu langen Gleichungen und komplizierten Berechnungen führt, ist die Unterstützung durch geeignete Software unerlässlich. Es wird eine Softwarelösung vorgestellt, welche die Anforderungen erfüllt und dem Benutzer die Umsetzung der neuen Methode erheblich erleichtert.

About the authors

Markus Zeier

Markus Zeier received the Dipl. Phys. degree and the PhD degree in experimental nuclear physics from the University of Basel, Switzerland, in 1993 and 1999. He is currently with the RF & MW Laboratory of the Federal Institute of Metrology METAS, Switzerland. His research interests are in RF & MW metrology and measurement uncertainty evaluation.

Federal Institute of Metrology METAS, Lindenweg 50, Bern-Wabern 3003, Switzerland, T: +41 58 387 04 91

Johannes Hoffmann

Johannes Hoffmann received the Dipl. Ing. degree in electrical engineering from the University of Stuttgart, Stuttgart, Germany, in 2005, the Ing. degree from the Ecole Nationale Superieure des Telecommunications (ENST), Paris, France, in 2005, in the course of a double diploma program. In 2009 he received the Ph.D. degree from ETH Zurich, Zurich, Switzerland. He is currently with the RF & MW Laboratory of the Federal Institute of Metrology METAS, Switzerland. His research interests are in general measurements, which involve microwaves, uncertainty calculation and numerical modeling.

Federal Institute of Metrology METAS, Lindenweg 50, Bern-Wabern 3003, Switzerland

Juerg Ruefenacht

Juerg Ruefenacht received the Bachelor's degree in electrical and electronic engineering from the Bern University of Applied Sciences, Bern, Switzerland, in 1986. From 1986 to 1998, he was with the Research and Development Department, Swisscom (formerly Swiss PTT). In 1998, he joined the Federal Instiute of Metrology METAS, Switzerland, where he is currently with the RF & MW laboratory.

Federal Institute of Metrology METAS, Lindenweg 50, Bern-Wabern 3003, Switzerland

Michael Wollensack

Michael Wollensack received the Bachelor degree in electrical and electronic engineering from the Bern University of Applied Sciences, Bern, Switzerland, in 2003. Since then he's with the RF & MW Laboratory, METAS Bern. His research interests are metrological and scientific software, VNA calibration algorithms and VNA measurement uncertainty calculation.

Federal Institute of Metrology METAS, Lindenweg 50, Bern-Wabern 3003, Switzerland

Acknowledgement

This work was partly funded through the European Metrology Research Programme (EMRP) Project SIB62 “Metrology for New Electrical Measurement Quantities in High-frequency Circuits”. The EMRP is jointly funded by the EMRP participating countries within EURAMET and the European Union.

Received: 2016-11-21
Revised: 2016-12-13
Accepted: 2016-12-14
Published Online: 2017-1-11
Published in Print: 2017-5-24

©2017 Walter de Gruyter Berlin/Boston

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