FIB-Zielpräparation von TEM-Proben mittels Nadelmanipulationstechnik / FIB-Pinpointed Preparation of TEM Samples by a Needle Based Manipulator (Lift-Out) Technique

Articles in the same Issue

1. Inhalt / Contents
2. Editorial
3. Vor- und Nachteile der TEM-Probenpräparation mittels FIB / Advantages and Disadvantages of TEM Sample Preparation Using the FIB Technique
4. FIB-Zielpräparation von TEM-Proben mittels Nadelmanipulationstechnik / FIB-Pinpointed Preparation of TEM Samples by a Needle Based Manipulator (Lift-Out) Technique
5. Literatur-Notizen / Literature Reviews
6. Materials Processing by Focused lon Beams for TEM Sample Preparation and Nanostructuring / Materialbearbeitung mittels fokussierter lonenstrahlen zur TEM-Probenpräraration und Nanostrukturierung
7. Literatur-Notizen / Literature Reviews
8. Preparation of Hard-to-Make TEM Samples Using the FIB Microscope / Präparation von kompliziert herstellbaren TEM-Proben mit dem FIB-Mikroskop
9. Mitteilungen / Information
10. Diskussionsforum / Topic of Discussion
11. Veranstaltungsankündigung / Event Announcement
12. Veranstaltungskalender / Meeting Diary