Depth-resolved residual stress evaluation from X-ray diffraction measurement data using the approximate inverse method
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T. Schuster
Abstract
The paper deals with the depth determination of residual stress states from diffraction data. First an historical overview of the known approaches is given. Then we apply the approximate inverse method to this problem. This method is known to be very efficient and stable with respect to noise-contaminated data. It is even possible to prove convergence and it allows an error estimate of the calculated depth resolved residual stress profile.
References
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© 2003 Carl Hanser Verlag, München
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- Personal/ Personelles
- Information
- Books/Bücher
- Conferences /Konferenzen
Articles in the same Issue
- Frontmatter
- Articles/Aufsätze
- An atomistic Monte Carlo simulation of precipitation in a binary system
- Thermodynamic assessment of the Pd–Zr system
- Cyclic deformation and dislocation structure evolution of a copper bicrystal with components rotating gradually along the grain boundary
- Microstructural characterization of alloys of the quasibinary Cu–NiBe system
- Microstructural characterisation and thermal stability of a metastable Mg-8.6 wt.% Zr alloy produced by physical vapour deposition
- Development of microstructure in solution-heat-treated Mg-5Al-xCa alloys
- The effect of Ti alloying on the mechanical properties and microstructure of a Zn–Al–Cu–Mg alloy
- Dry wear response of a Zn-based alloy containing 37.5% Al as affected by sliding conditions
- Microstructure selection map for rapidly solidified Al-rich Al–Sr alloys
- Dependence of the microstructure, residual stresses and texture of AA 6013 friction stir welds on the welding proces
- The effect of carbon on the restoration phenomena during hot deformation of carbon steels
- Deformation behavior during hot torsion of an ultrahigh carbon steel containing 1.3 wt.% C
- Effect of impact damage on electrical resistivity of C/C–SiC composites
- Depth-resolved residual stress evaluation from X-ray diffraction measurement data using the approximate inverse method
- Combined scanning probe microscopy and electron microscopy study of microstructure evolution in copper processed by equal channel angular pressing
- Notifications/Mitteilungen
- Personal/ Personelles
- Information
- Books/Bücher
- Conferences /Konferenzen
