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Inherent Resolution Limit Analysis for Millimeter-Wave Indirect Holographic Imaging

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Published/Copyright: August 25, 2011
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Frequenz
From the journal Volume 65 Issue 7-8

Abstract

In the classical indirect holographic setup, a wave emitted by the measurement object is superimposed with a reference wave at the aperture of the imaging system. The resulting interference pattern can be recorded with a simple intensity detection. However, the complex object field can be obtained from the plane wave spectrum (PWS) of the interference pattern. Dedicated methods can be used to calculate the field distribution at the object position, which is equivalent to the object properties and to an image of the object, respectively. This paper shows that the resolution of the created image is constricted due to the fact that the bandwidth of the extracted field is limited by the extraction process. A relation between the maximum possible bandwidth and the geometrical dimensions of the imager setup is deduced. Furthermore, a formula for the minimum achievable resolution is derived. Experimental results are presented to illustrate the issue.

Keywords.: Microwave measurement; microwave imaging; holographic imaging; resolution limitation
Corresponding author: Julian Adametz, Chair for Microwave Engineering and High Frequency Technology (LHFT), University of Erlangen-Nuremberg, Cauerstr. 9, 91058 Erlangen, Germany
Received: 2011-06-19
Published Online: 2011-08-25
Published in Print: 2011-August

Copyright © 2011 De Gruyter

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https://doi.org/10.1515/freq.2011.025
Keywords for this article
Microwave measurement; microwave imaging; holographic imaging; resolution limitation

Articles in the same Issue

  1. Special Issue GeMiC2011
  2. Inherent Resolution Limit Analysis for Millimeter-Wave Indirect Holographic Imaging
  3. A W-Band Heterodyne FMCW Radar Based on TX IQ-Modulation
  4. Broadband Patch Antenna with Polarization Multiplexing for K-Band Array Applications
  5. A 77 GHz Near-Field Probe with Integrated Illuminating Waveguide used for Reflectarray Characterization
  6. Time-Domain Emission Measurements in K-Band
  7. Load-Pull Investigation of a High-Voltage RF-Power GaN-HEMT Technology in Supply Modulated Applications
  8. Wireless Temperature Sensing with BST-Based Chipless Transponder Utilizing a Passive Phase Modulation Scheme
  9. Wireless Measurement System for Extracting Open Loop Micro Coil Parameters
  10. CRLH-TL Sensors for Flow Inhomogeneties Detection of Pneumatic Conveyed Pulverized Solids
  11. Dispersion Analysis of Periodic Structures by Solving Corresponding Excitation Problems
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