Effect of moisture content on dielectric properties of banana leaves and peels in frequency range of 1–20 GHz

Soumya Sundar Pattanayak; Soumen Biswas

doi:10.1515/freq-2021-0136

Article

Effect of moisture content on dielectric properties of banana leaves and peels in frequency range of 1–20 GHz

Soumya Sundar Pattanayak and Soumen Biswas

Published/Copyright: October 29, 2021

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From the journal Frequenz Volume 76 Issue 3-4

Abstract

The quality of agricultural products can be remotely sensed and enhanced by determining the dielectric properties. This paper studies the dielectric properties of banana leaf and banana peel over the frequency range 1–20 GHz using the open-ended coaxial probe (OCP) method. A new curve fitting model is proposed to characterize the dielectric properties of banana leaf and banana peel. The different moisture content (MC) levels are considered for both banana leaf and banana peel samples and, their dielectric properties are characterized. Further, the banana leaf and banana peel’s measurement data are compared with the data obtained using the proposed model. In addition, Root Mean Square Error (RMSE) and R-squared (R ²) are calculated to validate the performance of the proposed model. In case of banana leaf at 68.26% MC, the dielectric constant achieves the value of R ² and RMSE of 0.98 and 0.0648, respectively. Similarly, dielectric loss achieves the value of R ² and RMSE of 0.88 and 0.0795, respectively. Further, for banana peel at 80.89% MC, the dielectric constant achieves the value of R ² and RMSE of 0.99 and 0.2989, respectively. Similarly, dielectric loss achieves the value of R ² and RMSE of 0.96 and 0.6132, respectively.

Keywords: curve fitting; dielectric properties; moisture constant; open-ended coaxial probe (OCP) method

Corresponding author: Soumen Biswas, Electronics and Instrumentation Engineering Department, National Institute of Technology Silchar, Silchar, Assam, 788010, India, E-mail: soumenbiswas@outlook.com

Acknowledgment

We would like to thank Electronics and Instrumentation Engineering Department, National Institute of Technology Silchar for measurement support. We also would like to acknowledge the Physics Department, National Institute of Technology Silchar for their unconditional support in sample preparation.

Author contributions: All the authors have accepted responsibility for the entire content of this submitted manuscript and approved submission.
Research funding: None declared.
Conflict of interest statement: The authors declare no conflicts of interest regarding this article.

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Received: 2021-06-01

Accepted: 2021-10-08

Published Online: 2021-10-29

Published in Print: 2022-04-26

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Articles in the same Issue

https://doi.org/10.1515/freq-2021-0136

Keywords for this article

curve fitting; dielectric properties; moisture constant; open-ended coaxial probe (OCP) method