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Circuits for disjunction admitting short unitary diagnostic tests
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S. R. Bedzhanova
Published/Copyright:
January 7, 2011
Abstract
We study tests for circuits realising disjunction. In a circuit, the inversion fault is allowed at the output of precisely one functional element. For any functionally complete basis B it is found that for any n ≥ 3 the disjunction of n variables can be realised by a circuit over B which admits a unitary diagnostic test consisting of at most two tuples. It is proved that this result cannot be improved in the general case.
Received: 2010-04-19
Published Online: 2011-01-07
Published in Print: 2010-December
© de Gruyter 2010
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Articles in the same Issue
- Bounds for the number of Boolean functions admitting affine approximations of a given accuracy
- Identification of a binary Markov chain of order s with r partial connections subjected to additive distortions
- On conditional Internet graphs whose vertex degrees have no mathematical expectation
- An estimate of the probability of localisation of the diameter of a random scale-free graph
- On a recursive class of plateaued Boolean functions
- On the distribution of some characteristics of a quasimonotone mapping
- The expressibility problem in a lattice with closure operation
- An algorithm to restore a linear recurring sequence over the ring R = Zpn from a linear complication of its highest coordinate sequence
- The uniform id-decomposition of functions of many-valued logic over homogeneous functions
- The completeness problem in the function algebra of linear integer-coefficient polynomials
- Circuits for disjunction admitting short unitary diagnostic tests
- The group of automorphisms of the set of bent functions
- Complexity of multiplication in commutative group algebras over fields of prime characteristic
- The summation of Markov sequences on a finite abelian group
- The asymptotics of the number of repetition-free Boolean functions in the basis B1
