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Some classes of easily testable circuits in the Zhegalkin basis

  • Yulia V. Borodina EMAIL logo
Published/Copyright: February 24, 2023

Abstract

We identify the classes of Boolean functions that may be implemented by easily testable circuits in the Zhegalkin basis for constant type-1 faults on outputs of gates. An upper estimate for the length of a complete fault detection test for three-place functions is obtained.

References

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Received: 2021-08-17
Published Online: 2023-02-24
Published in Print: 2023-02-23

© 2023 Walter de Gruyter GmbH, Berlin/Boston

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