Home On diagnostic tests of contact break for contact circuits
Article
Licensed
Unlicensed Requires Authentication

On diagnostic tests of contact break for contact circuits

  • Kirill A. Popkov EMAIL logo
Published/Copyright: April 29, 2020

Abstract

We prove that, for n ⩾ 2, any n-place Boolean function may be implemented by a two-pole contact circuit which is irredundant and allows a diagnostic test with length not exceeding n + k(n − 2) under at most k contact breaks. It is shown that with k = k(n) ⩽ 2n−4, for almost all n-place Boolean functions, the least possible length of such a test is at most 2k + 2.


Note: Originally published in Diskretnaya Matematika (2019) 31, №2, 123–142 (in Russian).


  1. Funding: This research was carried out with the support of the program 01 “Fundamental Mathematics and its Applications” of the Presidium of the Russian Academy of Sciences (grant PRAS-18-01).

References

[1] Lupanov O.B., Asymptotic bounds on complexity of control systems, M.: Izd-vo Mosk. un-ta, 1984 (in Russian), 138 pp.Search in Google Scholar

[2] Chegis I. A., Yablonskii S.V., “Logical methods for control of electric circuits”, Tr. MIAN SSSR, 51 (1958), 270–360 (in Russian).Search in Google Scholar

[3] Yablonskiy S. V., “Reliability and control systems monitoring”, Materialy Vsesoyuznogo seminara po diskretnoy matematike i ee prilozheniyam, M.: Izd-vo Mosk. un-ta, 1986, 7–12 (in Russian).Search in Google Scholar

[4] Yablonskiy S. V., “Some problems of reliability and monitoring of control systems”, Matematicheskie voprosy kibernetiki, M.: Nauka, 1988, 5–25 (in Russian).Search in Google Scholar

[5] Reďkin N. P., Reliability and diagnostics schemes, M.: Izd-vo Mosk. un-ta, 1992 (in Russian), 192 pp.Search in Google Scholar

[6] Kolyada S. S., Upper bounds for the length of validation tests for circuits of functional elements, Diss. na soisk. uch. st. k.f.-m.n., Moscow, 2013 (in Russian), 77 pp.Search in Google Scholar

[7] Madatyan Kh. A., “Complete test for non-repeating contact circuits”, Problemy kibernetiki, Nauka, Moscow, 1970, 103–118 (in Russian).Search in Google Scholar

[8] Reďkin N. P., “On complete fault detection tests for contact circuits”, Metody diskretnogo analiza v issledovanii ekstrmaľnykh struktur, Izd-vo IM SO AN SSSR, Novosibirsk, 1983, 80–87 (in Russian).Search in Google Scholar

[9] Reďkin N. P., “On checking tests of closure and opening”, Metody diskretnogo analiza v optimizatsii upravlyayushchikh sistem, Vyp. 40, IM SO AN SSSR, Novosibirsk, 1983, 87–99 (in Russian).Search in Google Scholar

[10] Romanov D. S., “On the synthesis of contact circuits that allow short fault detection tests”, Uchenye zapiski Kazanskogo universiteta. Fiziko-matematicheskie nauki, 156:3 (2014), 110–115 (in Russian).Search in Google Scholar

[11] Popkov K. A., “Tests of contact closure for contact circuits”, Discrete Math. Appl., 26:5 (2016), 299–308.10.1515/dma-2016-0025Search in Google Scholar

[12] Popkov K. A., “On fault detection tests of contact break for contact circuits”, Discrete Math. Appl., 28:6 (2018), 369–383.10.1515/dma-2018-0033Search in Google Scholar

[13] Yablonskiy S. V., Introduction to Discrete Mathematics, Nauka, Moscow, 1986 (in Russian), 384 pp.Search in Google Scholar

Received: 2018-12-13
Revised: 2019-05-17
Published Online: 2020-04-29
Published in Print: 2020-04-28

© 2020 Walter de Gruyter GmbH, Berlin/Boston

Downloaded on 30.11.2025 from https://www.degruyterbrill.com/document/doi/10.1515/dma-2020-0010/pdf
Scroll to top button