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On the synthesis of circuits admitting complete fault detection test sets of constant length under arbitrary constant faults at the outputs of the gates

  • D. S. Romanov
Published/Copyright: February 7, 2014

Abstract

We describe a method of construction of circuits over some special basis admitting complete tests detecting arbitrary constant faults at the outputs of gates and having length not exceeding 4.

Published Online: 2014-02-07
Published in Print: 2013-06

© 2014 by Walter de Gruyter GmbH & Co.

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