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On the synthesis of circuits admitting complete fault detection test sets of constant length under arbitrary constant faults at the outputs of the gates
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D. S. Romanov
Published/Copyright:
February 7, 2014
Abstract
We describe a method of construction of circuits over some special basis admitting complete tests detecting arbitrary constant faults at the outputs of gates and having length not exceeding 4.
Published Online: 2014-02-07
Published in Print: 2013-06
© 2014 by Walter de Gruyter GmbH & Co.
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- Distance-regular graph with the intersection array {45, 30, 7; 1, 2, 27} does not exist
- The impact of the growth rate of the packing number of graphs on the computational complexity of the independent set problem
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- Identities with permutations and quasigroups isotopic to groups and to Abelian groups
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