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Erratum to: Ultrafast Bessel beams: advanced tools for laser materials processing

This erratum corrects the original online version which can be found here: https://doi.org/10.1515/aot-2018-0009
  • Razvan Stoian EMAIL logo , Manoj K. Bhuyan , Guodong Zhang , Guanghua Cheng , Remy Meyer and Francois Courvoisier
Published/Copyright: May 9, 2019
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Advanced Optical Technologies
From the journal Advanced Optical Technologies Volume 8 Issue 6

Erratum to: Razvan Stoian, Manoj K. Bhuyan, Guodong Zhang, Guanghua Cheng, Remy Meyer, and Francois Courvoisier. 2018. Ultrafast Bessel beams: advanced tools for laser materials processing. Advanced Optical Technologies. Volume 7, Issue 3, pages 165–174. (DOI:10.1515/aot-2018-0009):

In the online and the printed issue of Advanced Optical Technologies [1] an error in Figure 2 occurred. The scale in Figure 2A, D is 3 μm. The correct figure is published here.

Figure 2: Bessel beams interaction with transparent materials [61], [63]. (A) Input surface pattern generated by a singe shot tightly focused ultrashort (60 fs, 14 μJ) Bessel beam (θair=22°) on fused silica; scanning electron microscope (SEM) image. The Bessel ring pattern is recognizable. (B) A high aspect ratio structure in the form of a one-dimensional void in bulk fused silica generated by a single shot ps stretched low focused Bessel beam (2 ps, 26 μJ, θglass=4°), viewed as low refractive index domain by phase-contrast microscopy (PCM). (C) Positive refractive index engineering with multishot (n=500) ultrashort moderately focused Bessel beam (60 fs, 1 μJ, θglass=8°); PCM image [61]. Dark colors denote a positive index change and white colors a negative change, respectively. (D) Back surface (exit surface) nanoscale structure in fused silica induced by a single shot moderately-focused ps stretched laser pulse (5 ps, 14 μJ, θglass=8°); SEM image. (E) Nanoscale void in sapphire (140 fs, 2 μJ, θsapphire=15°) [62] drilled by a single laser pulse and viewed with SEM after FIB milling. The used energies correspond to fluence values in air (in the absence of nonlinear distortions) from several J/cm2 up to several tens of J/cm2. Laser direction is marked.
Figure 2:

Bessel beams interaction with transparent materials [61], [63]. (A) Input surface pattern generated by a singe shot tightly focused ultrashort (60 fs, 14 μJ) Bessel beam (θair=22°) on fused silica; scanning electron microscope (SEM) image. The Bessel ring pattern is recognizable. (B) A high aspect ratio structure in the form of a one-dimensional void in bulk fused silica generated by a single shot ps stretched low focused Bessel beam (2 ps, 26 μJ, θglass=4°), viewed as low refractive index domain by phase-contrast microscopy (PCM). (C) Positive refractive index engineering with multishot (n=500) ultrashort moderately focused Bessel beam (60 fs, 1 μJ, θglass=8°); PCM image [61]. Dark colors denote a positive index change and white colors a negative change, respectively. (D) Back surface (exit surface) nanoscale structure in fused silica induced by a single shot moderately-focused ps stretched laser pulse (5 ps, 14 μJ, θglass=8°); SEM image. (E) Nanoscale void in sapphire (140 fs, 2 μJ, θsapphire=15°) [62] drilled by a single laser pulse and viewed with SEM after FIB milling. The used energies correspond to fluence values in air (in the absence of nonlinear distortions) from several J/cm2 up to several tens of J/cm2. Laser direction is marked.

Reference

[1] R. Stoian, M. Bhuyan, G. Cheng, G. Zhang, R. Meyer, et al., Adv. Opt. Technol. 7, 165–174 (2018).10.1515/aot-2018-0009Search in Google Scholar

Published Online: 2019-05-09
Published in Print: 2019-12-18

©2019 THOSS Media & De Gruyter, Berlin/Boston

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https://doi.org/10.1515/aot-2019-0029

Articles in the same Issue

  1. Cover and Frontmatter
  2. Views
  3. Sixty years of advanced imaging at the French-German Research Institute of Saint-Louis: from the Cranz-Schardin camera to computational optics
  4. Community
  5. Conference Notes
  6. Topical Issue: Active Imaging
  7. Editorial
  8. Active imaging
  9. Review Article
  10. Nick-named laser radars
  11. Research Articles
  12. Experimental SWIR gated viewing in accumulation mode
  13. InGaAs APD matrix sensors for SWIR gated viewing
  14. Modelling and impact of the turbulence effect on flash and cumulative 2D active imaging system
  15. Laser-based imaging applications in turbid waters
  16. Review Article
  17. Reflectors in lighting design
  18. Research Articles
  19. A procedure for designing and manufacturing microstructured lenses used in automotive headlamps
  20. Fabrication of textured substrates for dye-sensitized solar cells using polydimethylsiloxane nanoimprint lithography
  21. 10.1515/aot-2019-0023
  22. 10.1515/aot-2018-0072
  23. 10.1515/aot-2019-0021
  24. Erratum
  25. Erratum to: Ultrafast Bessel beams: advanced tools for laser materials processing
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