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Spectral laser damage testing of optical materials

  • Sven Schröder EMAIL logo , Méabh Garrick , Anne-Sophie Munser and Marcus Trost
Published/Copyright: July 19, 2017
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Abstract

The spectral laser-induced damage of optical components was measured using a new instrument based on combining a laser-induced damage threshold (LIDT) testing procedure with angle-resolved light scattering and using a tunable optical parametric oscillator laser source. Tests on aluminum mirrors revealed a significant drop of the LIDT around 800 nm, which is not predicted by simple scaling laws. For near-infrared edge filters, remarkable changes in the LIDT around the band edge were observed, which are linked to the spectral variation of the field distribution in the interference coating.

Acknowledgments

The authors gratefully acknowledge the support of the colleagues of the Fraunhofer Institute of Applied Optics and Precision Engineering for the development of the instrument, in particular, Matthias Hauptvogel and Alexander von Finck. The fruitful discussions with international experts in the field, in particular, with Lars Jensen, Istvan Balasa, and Detlev Ristau from Laser Zentrum Hannover and with Xinbin Cheng and Zhanshan Wang from Tongji University Shanghai are highly appreciated. This work was supported by the program ‘Zentrales Innovations programm Mittelstand (ZIM)’ of the German Ministry of Economy and Technology (BMWi), project LOSASS (ZF4023002RE6).

References

[1] L. Lamaignère, in ‘Laser-Induced Damage in Optical Materials’, Ed. by D. Ristau (Taylor & Francis, Boca Raton, 2015).Search in Google Scholar

[2] M. Mero, J. Liu, W. Rudolph, D. Ristau and K. Starke, Phys. Rev. B 71, 115109 (2005).10.1103/PhysRevB.71.115109Search in Google Scholar

[3] C. W. Carr, H. B. Radousky and S. G. Demos, Phys. Rev. Lett. 91, 127402 (2003).10.1103/PhysRevLett.91.127402Search in Google Scholar PubMed

[4] X. Cheng, J. Zhang, T. Ding, Z. Wei, H. Li, et al., in ‘Optical Interference Coatings’, Ed. by M. Tilsch and D. Ristau (OSA Technical Digest, 2013); (July 10, 2017). Available: https://www.osapublishing.org/abstract.cfm?uri=OIC-2013-FB.1.Search in Google Scholar

[5] L. Gallais, J. Capoulade, J.-Y. Natoli, M. Commandré, M. Cathelinaud, et al., Appl. Opt. 47, C107-13 (2008).10.1364/AO.47.00C107Search in Google Scholar PubMed

[6] S. Schröder, D. Unglaub, M. Trost and A. Duparré, in ‘Optical Interference Coatings’, Ed. by M. Tilsch and D. Ristau (OSA Technical Digest, 2013) (July 10, 2017). Available: https://www.osapublishing.org/abstract.cfm?uri=OIC-2013-ThD.8.Search in Google Scholar

[7] S. Schröder, A. Duparré, in ‘Laser-Induced Damage in Optical Materials’, Ed. by D. Ristau (Taylor & Francis, Boca Raton, 2015).Search in Google Scholar

[8] ISO 21254, ‘Lasers and Laser-Related Equipment: Test Methods for Laser-Induced Damage Threshold’ (International Organization for Standardization, Geneva, Switzerland, 2011).Search in Google Scholar

[9] ISO 11254, ‘Laser and Laser-Related Equipment: Determination of Laser-Induced Damage Threshold of Optical Surfaces’ (International Organization for Standardization, Geneva, Switzerland, 2000).Search in Google Scholar

[10] B. L. Harlamoff and J. J. Jacob, ‘Narrow Linewidth BBO Optical Paramateric Oscillator Utilizing Extraordinary Resonance’, US 5594592 A (1995).Search in Google Scholar

[11] D. Douti, L. Gallais and M. Commandré, Opt. Eng 53, 122509–122509 (2014).10.1117/1.OE.53.12.122509Search in Google Scholar

[12] C. Carr, H. Radousky and S. Demos, S., Phys. Rev. Lett. 91, 127402 (2003).10.1103/PhysRevLett.91.127402Search in Google Scholar

[13] H. Wang, H. Qi, B. Wang, Y. Cui, M. Guo, et al., Opt. Express 23, 5213–5220 (2015).10.1364/OE.23.005213Search in Google Scholar PubMed

[14] S. Schröder, T. Herffurth, H. Blaschke and A. Duparré, Appl. Opt. 50, C164–C171 (2011).10.1364/AO.50.00C164Search in Google Scholar PubMed

[15] H. Ehrenreich, H. Philipp and B. Segall, Phys. Rev. B 132, 1918–1928 (1963).10.1103/PhysRev.132.1918Search in Google Scholar

[16] J. Krüger, S. Martin, H. Mädebach, L. Urech, T. Lippert, et al., Appl. Surf. Sci. 247, 406–411 (2004).10.1016/j.apsusc.2005.01.078Search in Google Scholar

[17] Z. Guosheng, P. M. Fauchet and A. E. Siegman, Phys. Rev. B 26, 5366 (1982).10.1103/PhysRevB.26.5366Search in Google Scholar

[18] K. Ahmmed, C. Grambow and A. Kietzig, Micromachines 5, 1219–1253 (2014).10.3390/mi5041219Search in Google Scholar

[19] J. Neauport, E. Lavastre, G. Razé, G. Dupuy, N. Bonod, et al., Opt. Express 15, 12508–12522 (2007).10.1364/OE.15.012508Search in Google Scholar

[20] S. Schröder, D. Unglaub, M. Trost, X. Cheng, J. Zhang, et al., Appl. Opt. 53, A35–A41 (2014).10.1364/AO.53.000A35Search in Google Scholar PubMed

[21] D. Gill, B. Newnam and J. Mcleod, IEEE J. Quantum Electron 13, 866–867 (1977).10.1109/JQE.1977.1069532Search in Google Scholar

[22] S. Schröder, M. Trost, M. Garrick and A. Duparré, Thin Solid Films 592, 248–255 (2015).10.1016/j.tsf.2015.02.077Search in Google Scholar

[23] T. Herffurth, S. Schröder, M. Trost, A. Duparré and A. Tünnermann, Appl. Optics 52, 3279–3287 (2013).10.1364/AO.52.003279Search in Google Scholar PubMed

Received: 2017-4-20
Accepted: 2017-6-1
Published Online: 2017-7-19
Published in Print: 2017-10-26

©2017 THOSS Media & De Gruyter, Berlin/Boston

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