Home Optical simulation of microstructured surfaces
Article
Licensed
Unlicensed Requires Authentication

Optical simulation of microstructured surfaces

  • Donald J. Schertler EMAIL logo and Paul O. McLaughlin
Published/Copyright: January 20, 2015
Become an author with De Gruyter Brill

Abstract

We present techniques and results of optical simulations of microstructured surfaces using BSDF measurements.


Corresponding author: Donald J. Schertler, RPC Photonics, Inc., 330 Clay Rd. Rochester, NY 14623, USA, e-mail:

References

[1] J. C. Stover, ‘Optical Scattering, Measurement and Analysis’, 2nd ed. (SPIE Press, Bellingham, WA, USA, 1995).10.1117/3.203079Search in Google Scholar

[2] P. Beckman and A. Spizzichino, ‘The Scattering of Electromagnetic Waves from Rough Surfaces’ (Pergamon Press, New York, NY, USA, 1963).Search in Google Scholar

[3] J. E. Harvey, ‘Light scattering characteristics of optical surfaces,’ Ph.D. Dissertation, University of Arizona, (1976).10.21236/ADA095132Search in Google Scholar

[4] Engineered Diffuser™ is a trademark of RPC Photonics, Inc., Rochester, NY, USA.Search in Google Scholar

[5] Simulations were performed using ASAP from Breault Research Organization, Tucson, AZ, USA.Search in Google Scholar

[6] Intensity distributions in angle space correspond to Type B photometry of the Illuminating Engineering Society, New York, NY, USA. Measured intensity distributions correspond to Type C photometry.Search in Google Scholar

Received: 2014-10-27
Accepted: 2014-12-17
Published Online: 2015-1-20
Published in Print: 2015-2-1

©2015 THOSS Media & De Gruyter

Downloaded on 7.9.2025 from https://www.degruyterbrill.com/document/doi/10.1515/aot-2014-0053/html?lang=en
Scroll to top button