Home Technology APPLICATIONS OF X-RAY PHOTOELECTRON SPECTROSCOPY AND STATIC SECONDARY ION MASS SPECTROMETRY IN SURFACE CHARACTERIZATION OF COPOLYMERS AND POLYMERS BLENDS
Article
Licensed
Unlicensed Requires Authentication

APPLICATIONS OF X-RAY PHOTOELECTRON SPECTROSCOPY AND STATIC SECONDARY ION MASS SPECTROMETRY IN SURFACE CHARACTERIZATION OF COPOLYMERS AND POLYMERS BLENDS

  • Chi-Ming Chan, and Lu-Tao Weng,
Published/Copyright: December 1, 2000
Become an author with De Gruyter Brill

Published Online: 2000-12

©2011 by Walter de Gruyter GmbH & Co.

Downloaded on 5.3.2026 from https://www.degruyterbrill.com/document/doi/10.1515/REVCE.2000.16.4.341/html
Scroll to top button