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Calculation of Electrooptically Induced Refractive Index Changes of Integrated Optic Devices by the Finite-Element-Method
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S. Steinberg,
Published/Copyright:
December 1, 1991
Published Online: 1991-12
©2011 by Walter de Gruyter GmbH & Co.
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Articles in the same Issue
- Editorial
- Influence of the Laser Length on the Tunability, Linewidth and FM Response DFB Lasers with two Electrodes of Equal Lengths
- Calculation of Electrooptically Induced Refractive Index Changes of Integrated Optic Devices by the Finite-Element-Method
- Optical PSK Synchronous Heterodyne Experiments at 560 Mbit/s through 4 Gbit/s
- Upper Bounds on the Performance of the MPSK and Differentially Encoded MPSK Coherent Optical Systems Impaired by Laser Phase Noise
- Simple Empirical Formulae for Cutoff Frequencies of Few Moded Graded Index Fibers and Index Profile Determination
- Study and Valuation by Image Analysis of Bending Effects on LP11 Mode of an Optical Fiber
- News
Articles in the same Issue
- Editorial
- Influence of the Laser Length on the Tunability, Linewidth and FM Response DFB Lasers with two Electrodes of Equal Lengths
- Calculation of Electrooptically Induced Refractive Index Changes of Integrated Optic Devices by the Finite-Element-Method
- Optical PSK Synchronous Heterodyne Experiments at 560 Mbit/s through 4 Gbit/s
- Upper Bounds on the Performance of the MPSK and Differentially Encoded MPSK Coherent Optical Systems Impaired by Laser Phase Noise
- Simple Empirical Formulae for Cutoff Frequencies of Few Moded Graded Index Fibers and Index Profile Determination
- Study and Valuation by Image Analysis of Bending Effects on LP11 Mode of an Optical Fiber
- News
