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Failure Analysis
High Technology Devices
-
Daniel J. D. Sullivan
Language:
English
Published/Copyright:
2022
About this book
The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies.
- Covers methods and analytical techniques used to find root cause for failures in high technology devices.
- Examples from real experiences in failure analysis laboratories.
- Descriptions of how to perform the wok with details, not just theory.
Author / Editor information
Dr. Daniel J. D. Sullivan
attended Cal & U. C. San Diego. Managed: FA, Reliability and Materials labs. Currently in sales and marketing at EAG labs. He has also written a non-technical book, “Don’t Date Crazy” by DJDS, and published a board game called Infection.
Dr. Eric J. Carleton
is a technology developer and consultant who has incubated multiple technology startups, founded Arrhenius, a failure analysis firm, and serves clients in a wide array of industries on scientific analysis and litigation matters.
Topics
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Frontmatter
I -
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Contents
VII -
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Chapter 1 Introduction to FA
1 -
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Chapter 2 Why is FA important?
7 -
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Chapter 3 Planning out an FA
11 -
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Chapter 4 Typical types of failure mechanisms
17 -
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Chapter 5 Destructive versus nondestructive analysis
29 -
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Chapter 6 Optical Microscopy (OM)
33 -
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Chapter 7 Scanning Acoustic Microscopy/Tomography (SAM or SAT)
37 -
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Chapter 8 X-ray imaging (2D and 3D)
43 -
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Chapter 9 Time Domain Reflectometry (TDR)
47 -
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Chapter 10 Selecting the path before destructive analysis begins
51 -
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Chapter 11 Destructive work
55 -
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Chapter 12 Electrical Failure Analysis (EFA)
61 -
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Chapter 13 EMMI/OBIRCH/IR
67 -
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Chapter 14 Cross sections (X-sections)
73 -
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Chapter 15 Parallel lapping (p-lap)
83 -
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Chapter 16 Focused Ion Beam (FIB)
89 -
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Chapter 17 Scanning Electron Microscopy (SEM)
93 -
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Chapter 18 Transmission Electron Microscopy (TEM)
97 -
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Chapter 19 Energy Dispersive X-ray spectroscopy (EDX)
101 -
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Chapter 20 Use of additional materials analytical techniques and processes
105 -
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Chapter 21 How should these results be used?
111 -
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References
113 -
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Appendix
115 -
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List of figures
117 -
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Index
121
Publishing information
Pages and Images/Illustrations in book
eBook published on:
October 24, 2022
eBook ISBN:
9781501524790
Paperback published on:
October 24, 2022
Paperback ISBN:
9781501524783
Pages and Images/Illustrations in book
Front matter:
8
Main content:
120
Illustrations:
31
Coloured Illustrations:
51
Audience(s) for this book
Engineers and graduate students in materials science and high technology.
Safety & product resources
-
Manufacturer information:
Walter de Gruyter GmbH
Genthiner Straße 13
10785 Berlin
productsafety@degruyterbrill.com
