Home Rasterelektronenmikroskopische Untersuchungen von Querschliffen von Malschichtproben / Scanning Electron Microscopic Investigation of Cross-Sections Taken from Paint Layer Specimens
Article
Licensed
Unlicensed Requires Authentication

Rasterelektronenmikroskopische Untersuchungen von Querschliffen von Malschichtproben / Scanning Electron Microscopic Investigation of Cross-Sections Taken from Paint Layer Specimens

  • Gerhard Banik , Manfred Schreiner , Franz Mairinger and Herbert Stachelberger
Published/Copyright: April 15, 2025
Become an author with De Gruyter Brill

Online erschienen: 2025-04-15
Erschienen im Druck: 1982-02-01

© 2025 by Walter de Gruyter Berlin/Boston

Downloaded on 27.9.2025 from https://www.degruyterbrill.com/document/doi/10.1515/pm-1982-190205/html
Scroll to top button