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Serial Sectioning Techniques – a Versatile Method for Three-Dimensional Microstructural Imaging
The working group “Serial Sectioning Tomography” is headed by Prof. Dr.-Ing. Frank Mücklich.
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F. Mücklich
Veröffentlicht/Copyright:
1. August 2018
Received: 2018-05-24
Accepted: 2018-05-30
Published Online: 2018-08-01
Published in Print: 2018-08-16
© 2018, Carl Hanser Verlag, München
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Artikel in diesem Heft
- Contents/Inhalt
- Contents
- Editorial
- Editorial
- Technical Contributions/Fachbeiträge
- Chances and Challenges in Fusing Data Science with Materials Science
- Atom Probe Tomography
- Electron Tomography for 3D Imaging of Nanoscale Materials
- Laboratory Computed X-Ray Tomography – A Nondestructive Technique for 3D Microstructure Analyis of Materials
- Synchrotron Computer Tomography as a Characterization Method for Engineering Materials
- Serial Sectioning Techniques – a Versatile Method for Three-Dimensional Microstructural Imaging
Artikel in diesem Heft
- Contents/Inhalt
- Contents
- Editorial
- Editorial
- Technical Contributions/Fachbeiträge
- Chances and Challenges in Fusing Data Science with Materials Science
- Atom Probe Tomography
- Electron Tomography for 3D Imaging of Nanoscale Materials
- Laboratory Computed X-Ray Tomography – A Nondestructive Technique for 3D Microstructure Analyis of Materials
- Synchrotron Computer Tomography as a Characterization Method for Engineering Materials
- Serial Sectioning Techniques – a Versatile Method for Three-Dimensional Microstructural Imaging
