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SEM and TEM Methods for the Quantification of Gamma-Prime Precipitates in Nickel Alloys

  • M. Speicher , R. Scheck , D. Willer and K. Maile
Published/Copyright: April 28, 2017
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Practical Metallography
From the journal Practical Metallography Volume 54 Issue 5

Abstract

This work presents the quantitative evaluation of the gamma-prime phase for two nickel-based alloys which contain different proportions of this phase. Alloy 617 mod. was chosen here as an example for nickel alloys with a small volume fraction of the gamma-prime phase, while Alloy 263 was chosen as a material with a higher proportion. The examinations are performed in the scanning electron microscope (SEM) with high resolution as well as with a transmission electron microscope (TEM). The methods of quantitative recording are discussed. The results of the SEM and TEM analyses are compared and discussed. Several etching techniques were applied for the sample preparation.

Kurzfassung

In dieser Arbeit werden quantitative Auswertungen der Gamma-Strich-Phase für zwei Nickelbasislegierungen durchgeführt. Die beiden Werkstoffe weisen dabei unterschiedliche Anteile dieser Phase auf. Als Repräsentant der Nickellegierungen mit geringem Volumenanteil der Gamma-Strich-Phase wurde Alloy 617 mod. gewählt und als Werkstoff mit höherem Anteil Alloy 263. Die Untersuchungen werden sowohl im Rasterelektronenmikroskop (REM) mit hoher Auflösung als auch mithilfe des Transmissionselektronenmikroskops (TEM) durchgeführt. Die Methoden der quantitativen Erfassung werden erörtert. Eine Gegenüberstellung der Ergebnisse von REM- und TEM-Auswertungen wird durchgeführt und diskutiert. Dabei wurden für die Probenpräparation mehrere Ätzverfahren angewandt.

Translation: E. Engert

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Received: 2016-12-12
Accepted: 2017-03-07
Published Online: 2017-04-28
Published in Print: 2017-05-17

© 2017, Carl Hanser Verlag, München

Articles in the same Issue

  1. Contents/Inhalt
  2. Contents
  3. Editorial
  4. Editorial
  5. Technical Contributions/Fachbeiträge
  6. Process-Oriented Microstructure Evolution of Vss-V3Si-V5SiB2 Materials
  7. SEM and TEM Methods for the Quantification of Gamma-Prime Precipitates in Nickel Alloys
  8. Possibilities and Limits of Color Etching According to Klemm
  9. Failure Analysis
  10. 10.3139/147.110442
  11. Meeting Diary/Veranstaltungskalender
  12. Meeting Diary
https://doi.org/10.3139/147.110449

Articles in the same Issue

  1. Contents/Inhalt
  2. Contents
  3. Editorial
  4. Editorial
  5. Technical Contributions/Fachbeiträge
  6. Process-Oriented Microstructure Evolution of Vss-V3Si-V5SiB2 Materials
  7. SEM and TEM Methods for the Quantification of Gamma-Prime Precipitates in Nickel Alloys
  8. Possibilities and Limits of Color Etching According to Klemm
  9. Failure Analysis
  10. 10.3139/147.110442
  11. Meeting Diary/Veranstaltungskalender
  12. Meeting Diary
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