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Editorial
Published/Copyright:
August 27, 2019
Published Online: 2019-08-27
Published in Print: 2019-09-09
© 2019, Carl Hanser Verlag, München
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Articles in the same Issue
- Contents/Inhalt
- Contents
- Editorial
- Editorial
- Technical Contributions/Fachbeiträge
- Computed Tomography Meets Failure Analysis – XCT, the Failure Analyst's Darling
- Hydrogen-Induced Delayed Cracking
- Metallography of Intermetallic Titanium Aluminides – the (Additive) Manufacturing Makes the Difference
- Correlative Microscopy – Color Etching vs. Electron Backscatter Diffraction: Application Potenials and Limitations
- Meeting Diary/Veranstaltungskalender
- Meeting Diary
