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Intermetallic compounds at the interface between Sn–Cu(–Ni) solders and Cu substrate

  • Petr Harcuba , Miloš Janeček and Margarita Slámová†
Published/Copyright: June 11, 2013

Abstract

The influence of Cu content and Ni addition on the morphology and the growth kinetics of the intermetallic compound (IMC) layer formed at the interface of liquid Sn – Cu-based solders and the Cu substrate were investigated. The effects of temperature and reaction times on IMC morphology and thickness were studied. The reaction of a Sn-1.4Cu alloy with the substrate leads to the formation of a layer of Cu6Sn5 (-phase) of typical scallop morphology. At long reaction times, a Cu3Sn (-phase) is observed at the interface between the Cu substrate and the Cu6Sn5 layer. A small nickel addition to a Sn-0.6Cu alloy significantly changes the IMC morphology, accelerates its growth kinetics, prevents the formation of the Cu3Sn layer and reduces the rate of substrate dissolution. The effective activation energy of growth of the IMC layer in the Sn – Cu – Ni alloy was determined.


* Correspondence address, Petr Harcuba, MSc. Charles University Department of Physics of Materials Ke Karlovu 5, CZ-12116 Praha 2, Czech Republic Tel.: +420 21911458 Fax: +420 2191 1490 E-mail:

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Received: 2008-8-29
Accepted: 2009-4-2
Published Online: 2013-06-11
Published in Print: 2009-06-01

© 2009, Carl Hanser Verlag, München

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