Home Quantitative analysis of alkali feldspar minerals using Rietveld refinement of X-ray diffraction data
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Quantitative analysis of alkali feldspar minerals using Rietveld refinement of X-ray diffraction data

  • Sang-Heon Shim , Soo Jin Kim and Jung Ho Ahn
Published/Copyright: November 13, 2015
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Received: 1994-12-23
Accepted: 1996-5-2
Published Online: 2015-11-13
Published in Print: 1996-9-1

© 2015 by Walter de Gruyter Berlin/Boston

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