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Coronene as a Model of Charcoal: Calibration of the Carbon-13 NMR Shift Tensor to Count Carbon Atoms at the Plane Edge*
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H. A. Resing
Published/Copyright:
January 30, 1987
Published Online: 1987-1-30
Published in Print: 1987-1-1
© R. Oldenbourg Verlag, München
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Articles in the same Issue
- Magnetic Resonance Techniques for Surface Investigations*
- Differential T1 and T2 Relaxation of Coupled Spin Systems in High Magnetic Fields*
- Modern EPR-Related Methods in Surface Science and Heterogeneous Catalysis*
- Hydrogen Intercalation Compounds
- Variable Temperature Mössbauer Studies of Two-Dimensional Intercalation Compounds*
- Low Temperature Spin-Lattice Relaxation in TaS2(NH3)
- Diffusion Processes in LiC6 Studied by β-NMR*
- 7Li NMR Studies in Chevrel Phases LixMo6X8*
- 1H NMR Single Crystal Studies of Metal-Ammonia Intercalation Compounds in Layered Chalcogenides*
- NMR Studies of Hydrogen Containing Intercalation Compounds of h-WO3*
- 19F-NMR Investigations on SbF5-Graphite Intercalation Compounds*
- Motions Occurring in the Proton Conductor H2Sb4O11, 3H2O from 4 to 163 K Studied by Wide-Line Proton NMR Spectra Computation
- Coronene as a Model of Charcoal: Calibration of the Carbon-13 NMR Shift Tensor to Count Carbon Atoms at the Plane Edge*
- EPR of Cu2+ Ions in Pillared Clay*
- Electron Paramagnetic Resonance Studies of Interface Defects in Oxidized Silicon
- Structural Features at the Si — SiO2 Interface*
- Comparison of the Low-Temperature ESR Properties of Pb0 Defects Residing at the Interfaces of Differently-Oxidized Si/SiO2 Structures*
- On the Structure of Dangling Bond Defects in Silicon*
- Cyclotron Resonance Parameter Variations Induced by Paramagnetic Defects in Laser Processed Si*
- E′ Centers in Silicon Dioxide Films: A Comparison with Bulk Centers and their Role in “Rebound” Effects*
- Generation of Paramagnetic Point Defects in Silicon Dioxide Films on Silicon Through Electron Injection and Exposure to Ionizing Radiation*
- Defects at the Si/SiO2 Interface of SiO2 Precipitates in Silicon*
Articles in the same Issue
- Magnetic Resonance Techniques for Surface Investigations*
- Differential T1 and T2 Relaxation of Coupled Spin Systems in High Magnetic Fields*
- Modern EPR-Related Methods in Surface Science and Heterogeneous Catalysis*
- Hydrogen Intercalation Compounds
- Variable Temperature Mössbauer Studies of Two-Dimensional Intercalation Compounds*
- Low Temperature Spin-Lattice Relaxation in TaS2(NH3)
- Diffusion Processes in LiC6 Studied by β-NMR*
- 7Li NMR Studies in Chevrel Phases LixMo6X8*
- 1H NMR Single Crystal Studies of Metal-Ammonia Intercalation Compounds in Layered Chalcogenides*
- NMR Studies of Hydrogen Containing Intercalation Compounds of h-WO3*
- 19F-NMR Investigations on SbF5-Graphite Intercalation Compounds*
- Motions Occurring in the Proton Conductor H2Sb4O11, 3H2O from 4 to 163 K Studied by Wide-Line Proton NMR Spectra Computation
- Coronene as a Model of Charcoal: Calibration of the Carbon-13 NMR Shift Tensor to Count Carbon Atoms at the Plane Edge*
- EPR of Cu2+ Ions in Pillared Clay*
- Electron Paramagnetic Resonance Studies of Interface Defects in Oxidized Silicon
- Structural Features at the Si — SiO2 Interface*
- Comparison of the Low-Temperature ESR Properties of Pb0 Defects Residing at the Interfaces of Differently-Oxidized Si/SiO2 Structures*
- On the Structure of Dangling Bond Defects in Silicon*
- Cyclotron Resonance Parameter Variations Induced by Paramagnetic Defects in Laser Processed Si*
- E′ Centers in Silicon Dioxide Films: A Comparison with Bulk Centers and their Role in “Rebound” Effects*
- Generation of Paramagnetic Point Defects in Silicon Dioxide Films on Silicon Through Electron Injection and Exposure to Ionizing Radiation*
- Defects at the Si/SiO2 Interface of SiO2 Precipitates in Silicon*