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X-ray diffraction study of the piezoelectric properties of BiB3O6 single crystals
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Semen Gorfman
Published/Copyright:
September 25, 2009
We have determined all eight components of the piezoelectric tensor of a monoclinic crystal, BiB3O6, by means of synchrotron X-ray diffraction technique. The experiments have been performed on a four circle goniometer using the ω-scan method introduced by Graafsma [1] which is universal in the choice of appropriate reflections. The determined values of the piezoelectric tensor are in good agreement with those obtained earlier for BiB3O6 with the use of an optical Michelson interferometer.
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Received: 2006-December-20
Accepted: 2007-March-19
Published Online: 2009-09-25
Published in Print: 2007-07
© Oldenbourg Wissenschaftsverlag
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Keywords for this article
Piezoelectric effect;
External electric field;
X-ray diffraction;
Bismuth triborate
Articles in the same Issue
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- X-ray diffraction study of the piezoelectric properties of BiB3O6 single crystals
- Coupled Al/Si and O/N order/disorder in BaYb[Si4–xAlxOxN7–x]sialon: neutron powder diffraction and Monte Carlo simulations
- Temperature-dependent crystal structure analysis of methyl iodide by high-resolution neutron powder diffraction
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