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Untersuchungen über Umweganregung und ihre Vermeidung am Beispiel des Na2BeF4*

Published/Copyright: July 28, 2010
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Abstract

Measurements of x-ray-diffraction intensities of a Na2BeF4 single crystal were influenced by “Umweganregung” (multiple reflection) in the range of weak and medium peak intensities. A computer program was developed to calculate optimal settings for a two-circle diffractometer in order to avoid simultaneous reflections of considerable intensity contributions. The calculations of the program include primary-radiation divergence. Many “Renninger” peaks at positions of systematic absent reflections were observed and experimentally examined. At about 15% of the reflections in the range of copper- radiation “Umweganregung” was detected.

Published Online: 2010-07-28
Published in Print: 1969-05
Downloaded on 2.11.2025 from https://www.degruyterbrill.com/document/doi/10.1524/zkri.1969.129.1-4.101/html
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