@article{GUTBERLETVIEWEGSCHÖNHOFER+1966+701+704,
url = {https://doi.org/10.1524/teme.1966.360371.jg.701},
title = {Grenzen der Anwendbarkeit des 4-Spitzen-Gleichstrom- Meßverfahrens an Silicium-Proben, Teil II},
title = {},
author = {F. GUTBERLET-VIEWEG and F. X. SCHÖNHOFER},
pages = {701--704},
volume = {360-371},
number = {JG},
journal = {tm - Technisches Messen},
doi = {doi:10.1524/teme.1966.360371.jg.701},
year = {1966},
lastchecked = {2026-05-11}
}